Stable highly porous silicon oxycarbide glasses from pre-ceramic hybrids

2015 ◽  
Vol 3 (46) ◽  
pp. 23220-23229 ◽  
Author(s):  
M. Alejandra Mazo ◽  
Aitana Tamayo ◽  
Juan Rubio

The incorporation of Si–H bonds into a pre-ceramic hybrid leads to the formation of a highly porous interconnected silicon oxycarbide network which is preserved up to 1200 °C.

ChemInform ◽  
2010 ◽  
Vol 28 (6) ◽  
pp. no-no
Author(s):  
A. K. SINGH ◽  
C. G. PANTANO

2005 ◽  
Vol 79 (10) ◽  
pp. 2696-2704 ◽  
Author(s):  
Anant K. Singh ◽  
Carlo G. Pantano

1994 ◽  
Vol 342 ◽  
Author(s):  
I. BÁrsony ◽  
J.G.E. Klappe ◽  
É. Vázsonyi ◽  
T. Lohner ◽  
M. Fried

ABSTRACTChemical and mechanical stability of porous silicon layers (PSL) is the prerequisite of any active (luminescent) or passive (e.g. porous substrate) integrated applications. In this work X-ray diffraction (XRD) was used to analyze quantitatively the strain distribution obtained in different morphology PSL that were prepared on (100) p and p+Si substrates. Tetragonal lattice constant distortion can be as high as 1.4% in highly porous “as-prepared” samples. Incoherent optical heating RTO is governed by the absorption in the oxidized specimen. PSL show vertical inhomogeneity according to interpretation of spectroscopic ellipsometry (SE) data. Oxygen incorporation during RTO is controlled by specific surface (in p+ proportional, in p inversely proportional with porosity), while the developing compressive stress depends on pore size, and decreases with porosity in both morphologies.


2004 ◽  
Vol 24 (4) ◽  
pp. 601-605 ◽  
Author(s):  
Yujun Zhang ◽  
Alberto Quaranta ◽  
Gian Domenico Soraru

2017 ◽  
Vol 2 (33) ◽  
pp. 10865-10870 ◽  
Author(s):  
Chien-Hsin Tang ◽  
Wen-Jin Li ◽  
Chia-Hsiang Hung ◽  
Po-Hsuan Hsiao ◽  
Chia-Yun Chen

1994 ◽  
Vol 346 ◽  
Author(s):  
R.J.P. Corriu ◽  
D. Leclercq ◽  
P.H. Mutin ◽  
A. Vioux

ABSTRACTTwo silicon oxycarbide glasses with different compositions (O/Si ratio 1.2 and 1.8) were prepared by pyrolysis at moderate temperature (900 °C) of polysiloxane precursors. Their structure was investigated using quantitative 29Si solid-state NMR and X-ray photoelectron spectroscopy (XPS). The environment of the silicon atoms in the oxycarbide phase corresponded to a purely random distribution of Si-O and Si-C bonds depending on the O/Si ratio of the glass only and not on the structure of the precursors. At the light of the NMR results, the Si2p XPS spectra of the glasses may be interpreted using the contribution of the five possible SiOxC4-x tetrahedra. The Cls spectra of these glasses indicated the presence of oxycarbide carbon in CSi4 tetrahedra, similar to carbide carbon, and graphitic-like excess carbon.


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