scholarly journals Extracting local surface charges and charge regulation behavior from atomic force microscopy measurements at heterogeneous solid-electrolyte interfaces

Nanoscale ◽  
2015 ◽  
Vol 7 (39) ◽  
pp. 16298-16311 ◽  
Author(s):  
Cunlu Zhao ◽  
Daniel Ebeling ◽  
Igor Siretanu ◽  
Dirk van den Ende ◽  
Frieder Mugele
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Electrolyte ◽  
Surface Charges ◽  
Local Surface ◽  
Charge Regulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Heterogeneous Solid

In Situ Measurement of Solid Electrolyte Interphase Evolution on Silicon Anodes Using Atomic Force Microscopy

2016 ◽  
Vol 6 (12) ◽  
pp. 1600099 ◽  
Author(s):  
Insun Yoon ◽  
Daniel P. Abraham ◽  
Brett L. Lucht ◽  
Allan F. Bower ◽  
Pradeep R. Guduru
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Electrolyte ◽  
Solid Electrolyte Interphase ◽  
In Situ Measurement ◽  
Force Microscopy ◽  
Silicon Anodes ◽  
Atomic Force

scholarly journals Solid-electrolyte interphase nucleation and growth on carbonaceous negative electrodes for Li-ion batteries visualized with in situ atomic force microscopy

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Sergey Yu. Luchkin ◽  
Svetlana A. Lipovskikh ◽  
Natalia S. Katorova ◽  
Aleksandra A. Savina ◽  
Artem M. Abakumov ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Electrolyte ◽  
Solid Electrolyte Interphase ◽  
Nucleation And Growth ◽  
Li Ion Batteries ◽  
Force Microscopy ◽  
Electrode Potentials ◽  
Atomic Force ◽  
Li Ion

Abstract Li-ion battery performance and life cycle strongly depend on a passivation layer called solid-electrolyte interphase (SEI). Its structure and composition are studied in great details, while its formation process remains elusive due to difficulty of in situ measurements of battery electrodes. Here we provide a facile methodology for in situ atomic force microscopy (AFM) measurements of SEI formation on cross-sectioned composite battery electrodes allowing for direct observations of SEI formation on various types of carbonaceous negative electrode materials for Li-ion batteries. Using this approach, we observed SEI nucleation and growth on highly oriented pyrolytic graphite (HOPG), MesoCarbon MicroBeads (MCMB) graphite, and non-graphitizable amorphous carbon (hard carbon). Besides the details of the formation mechanism, the electrical and mechanical properties of the SEI layers were assessed. The comparative observations revealed that the electrode potentials for SEI formation differ depending on the nature of the electrode material, whereas the adhesion of SEI to the electrode surface clearly correlates with the surface roughness of the electrode. Finally, the same approach applied to a positive LiNi1/3Mn1/3Co1/3O2 electrode did not reveal any signature of cathodic SEI thus demonstrating fundamental differences in the stabilization mechanisms of the negative and positive electrodes in Li-ion batteries.

Probing Microbial Cell Surface Charges by Atomic Force Microscopy

Langmuir ◽  
2002 ◽  
Vol 18 (25) ◽  
pp. 9937-9941 ◽  
Author(s):  
François Ahimou ◽  
Frédéric A. Denis ◽  
Ahmed Touhami ◽  
Yves F. Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Surface ◽  
Microbial Cell ◽  
Surface Charges ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Determining amplitude and tilt of a lateral force microscopy sensor

2021 ◽  
Vol 12 ◽  
pp. 517-524
Author(s):  
Oliver Gretz ◽  
Alfred J Weymouth ◽  
Thomas Holzmann ◽  
Korbinian Pürckhauer ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Scanning Tunneling ◽  
Two Dimensional ◽  
Local Surface ◽  
Lateral Force Microscopy ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.

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