scholarly journals Nanoscale mapping of heterogeneity of the polarization reversal in lead-free relaxor–ferroelectric ceramic composites

Nanoscale ◽  
2016 ◽  
Vol 8 (4) ◽  
pp. 2168-2176 ◽  
Author(s):  
D. Gobeljic ◽  
V. V. Shvartsman ◽  
A. Belianinov ◽  
B. Okatan ◽  
S. Jesse ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Ferroelectric Ceramic ◽  
Ceramic Composites ◽  
Relaxor Ferroelectric ◽  
Lead Free ◽  
Polarization Reversal ◽  
Ferroelectric Relaxor ◽  
Force Microscopy

Heterogeneity of domain patterns and polarization switching in ferroelectric–relaxor ceramic composites were addressed using piezoresponse force microscopy.

Microstructure and local electrical investigation of lead-free α-La2WO6 ferroelectric thin films by piezoresponse force microscopy

2016 ◽  
Vol 617 ◽  
pp. 76-81
Author(s):  
Thomas Carlier ◽  
Marie-Hélène Chambrier ◽  
Anthony Ferri ◽  
Alexandre Bayart ◽  
Pascal Roussel ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Lead Free ◽  
Force Microscopy ◽  
Electrical Investigation

A novel ((Bi0.5Na0.5)0.94Ba0.06)1- (K0.5Nd0.5) TiO3 lead-free relaxor ferroelectric ceramic with large electrostrains at wide temperature ranges

2018 ◽  
Vol 44 (1) ◽  
pp. 571-579 ◽  
Author(s):  
Nianshun Zhao ◽  
Huiqing Fan ◽  
Xiaohu Ren ◽  
Shang Gao ◽  
Jiangwei Ma ◽  
...  
Keyword(s):  
Ferroelectric Ceramic ◽  
Relaxor Ferroelectric ◽  
Lead Free ◽  
Temperature Ranges

Nanoelectromechanics of Piezoresponse Force Microscopy: Contact Properties, Fields Below the Surface and Polarization Switching

2003 ◽  
Vol 784 ◽  
Author(s):  
S. V. Kalinin ◽  
Junsoo Shin ◽  
M. Kachanov ◽  
E. Karapetian ◽  
A. P. Baddorf
Keyword(s):  
Strain Distribution ◽  
Point Charge ◽  
Closed Form Solution ◽  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Ferroelectric Material ◽  
Form Solution ◽  
Force Microscopy ◽  
Force Magnitude ◽  
Resolution Limits

ABSTRACTTo achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, knowledge of elastic and electrostatic field distributions below the tip is required. The exact closed form solution of the coupled electroelastic problem for piezoelectric indentation is derived and used to obtain the tip-induced electric field and strain distribution in the ferroelectric material. This establishes a complete continuum mechanics description of the PFM imaging mechanism. These solutions are reduced to the point charge/force behavior for large separations from contact, and the applicability limits and charge/force magnitude for these models are established. The implications of these results for ferroelectric polarization switching processes are analyzed.

scholarly journals Asymmetry of Polarization Reversal and Current-Voltage Characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-Substrate Structures

2011 ◽  
Vol 2011 ◽  
pp. 1-5
Author(s):  
S. L. Bravina ◽  
N. V. Morozovsky ◽  
J. Costecalde ◽  
C. Soyer ◽  
D. Remiens ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Local Deformation ◽  
Dynamic Mode ◽  
Polarization Reversal ◽  
Si Substrate ◽  
Charge Voltage ◽  
Force Microscopy ◽  
Pzt Film ◽  
Current Voltage ◽  
Bipolar Charge

The characterization of the asymmetries of bipolar charge-voltage and current-voltage loops of polarization reversal and unipolar current-voltage curves for Pt/PZT-film/Pt:Ti/SiO2/Si-substrate systems was performed in the dynamic mode. The asymmetry of local deformation-voltage loops was observed by piezoresponse force microscopy. The comparison of the dependences of introduced asymmetry factors for the bipolar charge-voltage and current-voltage loops and unipolar current-voltage curves on drive voltage indicates the interconnection of ferroelectric and electrical space charge transfer asymmetries.

Impedance spectroscopy and piezoresponse force microscopy analysis of lead-free (1 − x) K0.5Na0.5NbO3 − xLiNbO3 ceramics

2013 ◽  
Vol 13 (2) ◽  
pp. 430-440 ◽  
Author(s):  
Radheshyam Rai ◽  
Indrani Coondoo ◽  
Rashmi Rani ◽  
Igor Bdikin ◽  
Seema Sharma ◽  
...  
Keyword(s):  
Impedance Spectroscopy ◽  
Piezoresponse Force Microscopy ◽  
Lead Free ◽  
Force Microscopy ◽  
Microscopy Analysis
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