Electrical and thermal conduction in ultra-thin freestanding atomic layer deposited W nanobridges

Nanoscale ◽  
2015 ◽  
Vol 7 (42) ◽  
pp. 17923-17928 ◽  
Author(s):  
Nathan T. Eigenfeld ◽  
Jonas C. Gertsch ◽  
George D. Skidmore ◽  
Steven M. George ◽  
Victor M. Bright
Keyword(s):  
Thermal Conduction ◽  
Atomic Layer ◽  
Phonon Conduction

Electro/thermal conduction is reduced substantially in ultra-thin ALD W films. Evidence of phonon conduction appears in fabricated W structures.

Electrical and Thermal Conduction in Atomic Layer Deposition Nanobridges Down to 7 nm Thickness

Nano Letters ◽  
2012 ◽  
Vol 12 (2) ◽  
pp. 683-686 ◽  
Author(s):  
Shingo Yoneoka ◽  
Jaeho Lee ◽  
Matthieu Liger ◽  
Gary Yama ◽  
Takashi Kodama ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Thermal Conduction ◽  
Atomic Layer ◽  
Layer Deposition

Simulation of high-resolution annular dark field STEM images

1995 ◽  
Vol 53 ◽  
pp. 40-41
Author(s):  
E. J. Kirkland
Keyword(s):  
Electron Beam ◽  
Atomic Layer ◽  
Fresnel Diffraction ◽  
Dark Field ◽  
Objective Lens ◽  
Image Simulation ◽  
Small Probe ◽  
Annular Dark Field ◽  
Stem Image ◽  
Uniform Plane

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.

Application of Atomic Layer Deposition in Dye-Sensitized Photoelectrosynthesis Cells

2021 ◽  
Vol 3 (1) ◽  
pp. 59-71
Author(s):  
Degao Wang ◽  
Qing Huang ◽  
Weiqun Shi ◽  
Wei You ◽  
Thomas J. Meyer
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Dye Sensitized ◽  
Layer Deposition
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