Effects of length dispersity and film fabrication on the sheet resistance of copper nanowire transparent conductors
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A combination of Rutherford Backscattering Spectrometry and Monte Carlo simulations were used to characterize the effect of post-treatment methods, area coverage and length distribution on the performance of copper nanowire-based transparent conductors.
2012 ◽
Vol 70
(4)
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pp. 1167-1172
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2021 ◽
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2011 ◽
Vol 1
(0)
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pp. 126-129
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