Impact of pore topology and crystal thickness of nanosponge zeolites on the hydroconversion of ethylbenzene

2016 ◽  
Vol 6 (8) ◽  
pp. 2653-2662 ◽  
Author(s):  
F. Marques Mota ◽  
P. Eliášová ◽  
J. Jung ◽  
R. Ryoo

Gas-phase hydroconversion of ethylbenzene was investigated using *MRE, MFI and MTW-type zeolite nanosponges with a hydrogenating component (Pt/Al2O3). Spacious channel interconnections in MFI was concluded to remarkably impact product selectivity compared to *MRE and MTW.

RSC Advances ◽  
2014 ◽  
Vol 4 (52) ◽  
pp. 27242-27249 ◽  
Author(s):  
Marilyne Boltz ◽  
Pit Losch ◽  
Benoit Louis ◽  
Guillaume Rioland ◽  
Lydie Tzanis ◽  
...  

Mass transfer limitations and catalytic activity were studied for various ZSM-5 zeolite crystal sizes in the chlorination of deactivated arenes. An estimation of the quantity of mild acidic external silanol groups of zeolite nanosheets was made.


2005 ◽  
Vol 44 (13) ◽  
pp. 4523-4533 ◽  
Author(s):  
Leonid Vradman ◽  
Moti Herskowitz ◽  
Libor Čapek ◽  
Blanka Wichterlová ◽  
Roald Brosius ◽  
...  

2000 ◽  
Vol 62 (4) ◽  
pp. 367-377 ◽  
Author(s):  
R López-Fonseca ◽  
A Aranzabal ◽  
P Steltenpohl ◽  
J.I Gutiérrez-Ortiz ◽  
J.R González-Velasco

2012 ◽  
Vol 17 ◽  
pp. 23-28 ◽  
Author(s):  
Dušan Stošić ◽  
Simona Bennici ◽  
Jean-Luc Couturier ◽  
Jean-Luc Dubois ◽  
Aline Auroux

ACS Catalysis ◽  
2018 ◽  
Vol 8 (12) ◽  
pp. 10950-10963 ◽  
Author(s):  
Wenna Zhang ◽  
Jingrun Chen ◽  
Shutao Xu ◽  
Yueying Chu ◽  
Yingxu Wei ◽  
...  

Author(s):  
G. Lehmpfuhl

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.


Author(s):  
J. S. Lally ◽  
R. J. Lee

In the 50 year period since the discovery of electron diffraction from crystals there has been much theoretical effort devoted to the calculation of diffracted intensities as a function of crystal thickness, orientation, and structure. However, in many applications of electron diffraction what is required is a simple identification of an unknown structure when some of the shape and orientation parameters required for intensity calculations are not known. In these circumstances an automated method is needed to solve diffraction patterns obtained near crystal zone axis directions that includes the effects of systematic absences of reflections due to lattice symmetry effects and additional reflections due to double diffraction processes.Two programs have been developed to enable relatively inexperienced microscopists to identify unknown crystals from diffraction patterns. Before indexing any given electron diffraction pattern, a set of possible crystal structures must be selected for comparison against the unknown.


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