scholarly journals In situ characterization of the decomposition behavior of Mg(BH4)2 by X-ray Raman scattering spectroscopy

2016 ◽  
Vol 18 (7) ◽  
pp. 5397-5403 ◽  
Author(s):  
Christoph J. Sahle ◽  
Simon Kujawski ◽  
Arndt Remhof ◽  
Yigang Yan ◽  
Nicholas P. Stadie ◽  
...  
Keyword(s):  
Thermal Decomposition ◽  
Raman Scattering ◽  
Hydrogen Atmosphere ◽  
In Situ Characterization ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Decomposition Behavior

We present an in situ study of the thermal decomposition of Mg(BH4)2 in a hydrogen atmosphere of up to 4 bar and up to 500 °C using X-ray Raman scattering spectroscopy at the boron K-edge and the magnesium L2,3-edges.

scholarly journals In-situ characterization of highly reversible phase transformation by synchrotron X-ray Laue microdiffraction

2016 ◽  
Vol 108 (21) ◽  
pp. 211902 ◽  
Author(s):  
Xian Chen ◽  
Nobumichi Tamura ◽  
Alastair MacDowell ◽  
Richard D. James
Keyword(s):  
Phase Transformation ◽  
In Situ Characterization ◽  
X Ray ◽  
Reversible Phase ◽  
Laue Microdiffraction

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

In situ characterization of strain-induced crystallization of natural rubber by synchrotron radiation wide-angle X-ray diffraction: construction of a crystal network at low temperatures

Soft Matter ◽  
2019 ◽  
Vol 15 (4) ◽  
pp. 734-743 ◽  
Author(s):  
Pinzhang Chen ◽  
Jingyun Zhao ◽  
Yuanfei Lin ◽  
Jiarui Chang ◽  
Lingpu Meng ◽  
...  
Keyword(s):  
Low Temperatures ◽  
Structural Evolution ◽  
X Ray Diffraction ◽  
In Situ Characterization ◽  
X Ray ◽  
Crystal Network ◽  
Strain Induced Crystallization ◽  
Induced Crystallization

The structural evolution of NR during stretching at −40 °C and in the strain–temperature space.

In situ characterization of gas-filled microballoons using soft X-ray microspectroscopy

Soft Matter ◽  
2008 ◽  
Vol 4 (3) ◽  
pp. 510 ◽  
Author(s):  
George Tzvetkov ◽  
Birgit Graf ◽  
Paulo Fernandes ◽  
Andreas Fery ◽  
Francesca Cavalieri ◽  
...  
Keyword(s):  
In Situ Characterization ◽  
X Ray

In situ characterization of organometallic growth of ZnSe using grazing incidence X-ray scattering

1990 ◽  
Vol 101 (1-4) ◽  
pp. 42-47 ◽  
Author(s):  
D.W. Kisker ◽  
P.H. Fuoss ◽  
S. Brennan ◽  
G. Renaud ◽  
K.L. Tokuda ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
In Situ Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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