scholarly journals Pore orientation effects on the kinetics of mesostructure loss in surfactant templated titania thin films

2016 ◽  
Vol 18 (4) ◽  
pp. 2896-2905 ◽  
Author(s):  
Saikat Das ◽  
Suraj Nagpure ◽  
Ravinder K. Garlapalli ◽  
Qingliu Wu ◽  
Syed Z. Islam ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Thermally Induced ◽  
X Ray ◽  
Cylindrical Pore ◽  
X Ray Scattering ◽  
Orientation Effects ◽  
Titania Films ◽  
Kinetics Of

Grazing incidence small angle X-ray scattering (GISAXS) shows that thin titania films with uniform orthogonal cylindrical pore orientation are stabilized against thermally induced mesostructure loss.

Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering

2009 ◽  
Vol 113 (38) ◽  
pp. 12623-12627 ◽  
Author(s):  
Hong-Ji Chen ◽  
Sheng-Ying Li ◽  
Xiao-Jun Liu ◽  
Rui-Peng Li ◽  
Detlef-M. Smilgies ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Structures ◽  
Organosilicate Thin Films ◽  
Ray Scattering

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Structure of Glancing Incidence Deposited TiO2 Thin Films as Revealed by Grazing Incidence Small-Angle X-ray Scattering

ChemPhysChem ◽  
2010 ◽  
Vol 11 (10) ◽  
pp. 2205-2208 ◽  
Author(s):  
Lola González-García ◽  
Angel Barranco ◽  
Adela Muñoz Páez ◽  
Agustín R. González-Elipe ◽  
Mari-Cruz García-Gutiérrez ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Tio2 Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Detection of short range order in SiO2 thin-films by grazing-incidence wide and small-angle X-ray scattering

2016 ◽  
Vol 119 (15) ◽  
pp. 154103
Author(s):  
Kohki Nagata ◽  
Atsushi Ogura ◽  
Ichiro Hirosawa ◽  
Tomoyuki Suwa ◽  
Akinobu Teramoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Short Range ◽  
Short Range Order ◽  
Grazing Incidence ◽  
Range Order ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Morphology of nanostructured materials

2002 ◽  
Vol 74 (9) ◽  
pp. 1553-1570 ◽  
Author(s):  
M. K. Sanyal ◽  
A. Datta ◽  
S. Hazra
Keyword(s):  
Thin Films ◽  
Nanostructured Materials ◽  
Small Angle ◽  
Grazing Incidence ◽  
Bulk Properties ◽  
X Ray ◽  
X Ray Scattering ◽  
Grazing Incidence Diffraction ◽  
Ray Scattering

Here we shall discuss the importance of grazing incidence X-ray scattering techniques in studying morphology of nanostructured materials confined in thin films and multilayers. In these studies, the shapes, sizes, and structures of nanostructured materials and their distribution in composites are investigated. These studies are important for understanding properties that may deviate considerably from the known bulk properties. We shall first outline basics of three X-ray scattering techniques, namely X-ray reflectivity, grazing incidence small-angle X-ray scattering, and grazing incidence diffraction, used for these studies. We shall then demonstrate the utility of these techniques using some known results.

Sign in / Sign up

Export Citation Format

Share Document