Molecular orientation of organic thin films on dielectric solid substrates: a phase-sensitive vibrational SFG study

2015 ◽  
Vol 17 (27) ◽  
pp. 18072-18078 ◽  
Author(s):  
Aimin Ge ◽  
Qiling Peng ◽  
Lin Qiao ◽  
Nageshwar R. Yepuri ◽  
Tamim A. Darwish ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Organic Thin Films ◽  
Liquid Interfaces ◽  
Solid Substrates ◽  
Phase Sensitive ◽  
The Absolute ◽  
Solid Liquid

Phase-sensitive SFG spectroscopy is employed to determine the absolute molecular orientation on the solid/air and solid/liquid interfaces.

Molecular Orientation-Dependent Ionization Potential of Organic Thin Films

2008 ◽  
Vol 20 (22) ◽  
pp. 7017-7021 ◽  
Author(s):  
Wei Chen ◽  
Han Huang ◽  
Shi Chen ◽  
Yu Li Huang ◽  
Xing Yu Gao ◽  
...  
Keyword(s):  
Thin Films ◽  
Ionization Potential ◽  
Molecular Orientation ◽  
Organic Thin Films

Origins of polarization-dependent anisotropic X-ray scattering from organic thin films

2016 ◽  
Vol 23 (1) ◽  
pp. 219-227 ◽  
Author(s):  
Eliot Gann ◽  
Brian A. Collins ◽  
Maolong Tang ◽  
John R. Tumbleston ◽  
Subrangsu Mukherjee ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Organic Thin Films ◽  
Anisotropic Scattering ◽  
Isotropic Scattering ◽  
X Rays ◽  
General Measure ◽  
X Ray ◽  
X Ray Scattering ◽  
Local Correlations

Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such examples of molecular alignment at domain interfaces and within the bulk of domains, which are both critical to fields such as organic electronics, are simulated and compared with experimental scattering. Anisotropic scattering patterns are found to allow unambiguous identification of the mechanism of local molecular orientation correlations and, as such, promise to be both distinct and complementary to isotropic scattering intensity as a general measure of thin film microstructure.

Molecular orientation analysis of organic thin films by z -polarization Raman microscope

2012 ◽  
Vol 43 (12) ◽  
pp. 2029-2034 ◽  
Author(s):  
Toshihiro Mino ◽  
Yuika Saito ◽  
Hiroyuki Yoshida ◽  
Satoshi Kawata ◽  
Prabhat Verma
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Organic Thin Films ◽  
Orientation Analysis

Optical properties and molecular orientation in organic thin films

2003 ◽  
Vol 15 (38) ◽  
pp. S2699-S2718 ◽  
Author(s):  
M Friedrich ◽  
G Gavrila ◽  
C Himcinschi ◽  
T U Kampen ◽  
A Yu Kobitski ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Molecular Orientation ◽  
Organic Thin Films
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