Chemical selectivity in structure determination by the time dependent analysis of in situ XRPD data: a clear view of Xe thermal behavior inside a MFI zeolite

2015 ◽  
Vol 17 (26) ◽  
pp. 17480-17493 ◽  
Author(s):  
Luca Palin ◽  
Rocco Caliandro ◽  
Davide Viterbo ◽  
Marco Milanesio

PSD/PCA analysis of MED data allowed to enhance the chemical selectivity in X-ray powder diffraction and to obtain Xe substructure into MFI zeolite.

2020 ◽  
Author(s):  
Luzia S. Germann ◽  
Sebastian T. Emmerling ◽  
Manuel Wilke ◽  
Robert E. Dinnebier ◽  
Mariarosa Moneghini ◽  
...  

Time-resolved mechanochemical cocrystallisation studies have so-far focused solely on neat and liquid-assisted grinding. Here, we report the monitoring of polymer-assisted grinding reactions using <i>in situ</i> X-ray powder diffraction, revealing that reaction rate is almost double compared to neat grinding and independent of the molecular weight and amount of used polymer additives.<br>


2016 ◽  
Vol 4 (20) ◽  
pp. 7718-7726 ◽  
Author(s):  
Dorsasadat Safanama ◽  
Neeraj Sharma ◽  
Rayavarapu Prasada Rao ◽  
Helen E. A. Brand ◽  
Stefan Adams

In situ synchrotron X-ray diffraction study of the synthesis of solid-electrolyte Li1+xAlxGe2−x(PO4)3 (LAGP) from the precursor glass reveals that an initially crystallized dopant poor phase transforms into the Al-doped LAGP at 800 °C.


2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.


2018 ◽  
Vol 6 (30) ◽  
pp. 14651-14662 ◽  
Author(s):  
Laura Vitoux ◽  
Marie Guignard ◽  
Jacques Darriet ◽  
Claude Delmas

Phase diagram in the NaxMoO2system (x≤ 0.5) determined using electrochemistry andin situX-ray powder diffraction.


2001 ◽  
Vol 105 (13) ◽  
pp. 2604-2611 ◽  
Author(s):  
Michael F. Ciraolo ◽  
Jonathan C. Hanson ◽  
Poul Norby ◽  
Clare P. Grey

2000 ◽  
Vol 321-324 ◽  
pp. 374-379 ◽  
Author(s):  
J. Trommer ◽  
M. Schneider ◽  
H. Worzala ◽  
Andrew N. Fitch

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