The solid state conversion reaction of epitaxial FeF2(110) thin films with lithium studied by angle-resolved X-ray photoelectron spectroscopy

2015 ◽  
Vol 17 (23) ◽  
pp. 15218-15225 ◽  
Author(s):  
Ryan Thorpe ◽  
Sylvie Rangan ◽  
Ryan Whitcomb ◽  
Ali C. Basaran ◽  
Thomas Saerbeck ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Solid State ◽  
High Purity ◽  
Photoelectron Spectroscopy ◽  
Li Ion Battery ◽  
Conversion Reaction ◽  
X Ray ◽  
Li Ion ◽  
Battery Discharge

An epitaxial FeF2(110) thin film was exposed to Li as a high-purity analogue of a Li-ion battery discharge. The stoichiometry and morphology of the film were then characterized by ARXPS.

Operando soft X-ray emission spectroscopy of the Fe2O3 anode to observe the conversion reaction

2019 ◽  
Vol 21 (48) ◽  
pp. 26351-26357 ◽  
Author(s):  
Daisuke Asakura ◽  
Yusuke Nanba ◽  
Masashi Okubo ◽  
Hideharu Niwa ◽  
Hisao Kiuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Electronic Structure ◽  
Emission Spectroscopy ◽  
Li Ion Battery ◽  
Conversion Reaction ◽  
X Ray ◽  
Structure Changes ◽  
Li Ion

Drastic electronic-structure changes in an Fe2O3 thin film anode for a Li-ion battery during discharge (lithiation) and charge (delithiation) processes were observed using operando Fe 2p soft X-ray emission spectroscopy (XES).

scholarly journals X-ray Photoelectron Spectroscopy Analysis of Chitosan–Graphene Oxide-Based Composite Thin Films for Potential Optical Sensing Applications

Polymers ◽  
2021 ◽  
Vol 13 (3) ◽  
pp. 478
Author(s):  
Wan Mohd Ebtisyam Mustaqim Mohd Daniyal ◽  
Yap Wing Fen ◽  
Silvan Saleviter ◽  
Narong Chanlek ◽  
Hideki Nakajima ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
Functional Group ◽  
Optical Sensing ◽  
Composite Thin Films ◽  
Cobalt Ions ◽  
X Ray ◽  
Sensing Applications

In this study, X-ray photoelectron spectroscopy (XPS) was used to study chitosan–graphene oxide (chitosan–GO) incorporated with 4-(2-pyridylazo)resorcinol (PAR) and cadmium sulfide quantum dot (CdS QD) composite thin films for the potential optical sensing of cobalt ions (Co2+). From the XPS results, it was confirmed that carbon, oxygen, and nitrogen elements existed on the PAR–chitosan–GO thin film, while for CdS QD–chitosan–GO, the existence of carbon, oxygen, cadmium, nitrogen, and sulfur were confirmed. Further deconvolution of each element using the Gaussian–Lorentzian curve fitting program revealed the sub-peak component of each element and hence the corresponding functional group was identified. Next, investigation using surface plasmon resonance (SPR) optical sensor proved that both chitosan–GO-based thin films were able to detect Co2+ as low as 0.01 ppm for both composite thin films, while the PAR had the higher binding affinity. The interaction of the Co2+ with the thin films was characterized again using XPS to confirm the functional group involved during the reaction. The XPS results proved that primary amino in the PAR–chitosan–GO thin film contributed more important role for the reaction with Co2+, as in agreement with the SPR results.

scholarly journals Operando hard X-ray photoelectron spectroscopy of LiCoO2 thin film in an all-solid-state lithium ion battery

2020 ◽  
Vol 118 ◽  
pp. 106790
Author(s):  
Hisao Kiuchi ◽  
Kazuhiro Hikima ◽  
Keisuke Shimizu ◽  
Ryoji Kanno ◽  
Fukunaga Toshiharu ◽  
...  
Keyword(s):  
Thin Film ◽  
Solid State ◽  
Lithium Ion Battery ◽  
Photoelectron Spectroscopy ◽  
Lithium Ion ◽  
X Ray

Thermochromic VO2 Thin Film Prepared by Post Annealing Treatment of V2O5 Thin Film

2009 ◽  
Vol 79-82 ◽  
pp. 747-750 ◽  
Author(s):  
Dong Qing Liu ◽  
Wen Wei Zheng ◽  
Hai Feng Cheng ◽  
Hai Tao Liu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Transition ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Annealing Treatment ◽  
Simple Method ◽  
X Ray ◽  
Post Annealing ◽  
Vo2 Thin Films

Thermochromic vanadium dioxide (VO2) exhibits a semi-conducting to metallic phase transition at about 68°C, involving strong variations in electrical and optical properties. A simple method was proposed to prepare VO2 thin films from easily gained V2O5 thin films. The detailed thermodynamic calculation was done and the results show that V2O5 will decompose to VO2 when the post annealing temperature reaches 550°C at the atmospheric pressure of less than 0.06Pa. The initial V2O5 films were prepared by sol-gel method on fused-quartz substrates. Different post annealing conditions were studied. The derived VO2 thin film samples were characterized using X-ray diffraction and X-ray photoelectron spectroscopy. The electrical resistance and infrared emissivity of VO2 thin films under different temperatures were measured. The results show that the VO2 thin film derived from the V2O5 thin film annealed at 550°C for 10 hours is pure dioxide of vanadium without other valences. It was observed that the resistance of VO2 thin film with thickness about 600nm can change by 4 orders of magnitude and the 7.5-14μm emissivity can change by 0.6 during the phase transition.

Surface and Interface Analysis of LiCoO2 and LiPON Thin Films by Photoemission: Implications for Li-Ion Batteries

2015 ◽  
Vol 229 (9) ◽  
Author(s):  
René Hausbrand ◽  
André Schwöbel ◽  
Wolfram Jaegermann ◽  
Markus Motzko ◽  
David Ensling
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Charge Compensation ◽  
Compensation Mechanism ◽  
Li Ion Batteries ◽  
Li Ion Battery ◽  
Interface Formation ◽  
Interface Analysis ◽  
Surface And Interface ◽  
Li Ion

AbstractThin film technology is applied in different fields of Li-ion battery research and development, such as the fabrication of thin film cells and model electrodes. Data obtained by surface and interface analysis of thin films provides important insights into fundamental processes such as charge compensation mechanism or interface formation. In this overview, we present the analysis of LiCoO

Effects of Substrate Temperature on the Properties of Silicon Oxide Films by PECVD

2012 ◽  
Vol 198-199 ◽  
pp. 28-31
Author(s):  
Chun Ya Li ◽  
Xi Feng Li ◽  
Long Long Chen ◽  
Ji Feng Shi ◽  
Jian Hua Zhang
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electrical Properties ◽  
Photoelectron Spectroscopy ◽  
Deposition Temperature ◽  
Silicon Oxide ◽  
Chemical Vapor ◽  
Growth Conditions ◽  
X Ray ◽  
Glass Substrates

Under different growth conditions, silicon Oxide (SiOx) thin films were deposited successfully on Si (100) substrates and glass substrates by plasma enhanced chemical vapor deposition (PECVD). The thickness, refractive index and growth rate of the thin films were tested by ellipsometer. The effects of deposition temperature on the structure and properties of SiOx films were studied using X ray diffraction (XRD), X ray photoelectron spectroscopy (XPS) and UV-Visible spectroscopy. The results show that the SiOx films were amorphous at different deposition temperature. The peaks of Si2p and O1s shifted to higher binding energy with temperature increasing. The SiOx films had high transmissivity at the range of 400-900nm. By analyzing the observation and data, the influence of deposition parameters on the electrical properties and interface characteristics of SiOx thin film prepared by PECVD is systematically discussed. At last, SiOx thin film with excellent electrical properties and good interface characteristic is prepared under the relatively optimum parameters.

Photolysis and Photocatalysis of 1,4 Dichlorobenzene Using Sputtered TiO2 Thin Films

2012 ◽  
Vol 734 ◽  
pp. 215-225 ◽  
Author(s):  
Sawsan A. Mahmoud ◽  
Emre Yassitepe ◽  
S. Ismat Shah
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Aqueous Phase ◽  
Wavelength Range ◽  
Photoelectron Spectroscopy ◽  
X Ray Diffraction ◽  
Direct Photolysis ◽  
X Ray ◽  
Degradation Rates ◽  
Visible Irradiation

The rate of 1,4-dichlorobenzene (1,4-DCB) degradation in the aqueous phase was investigated under direct photolysis or photocatalysis in the presence of TiO2 thin film prepared by reactive sputtering using a metal Ti target and a reaction sputtering atmosphere of argon and oxygen. The prepared thin films were analyzed by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). XPS confirmed the presence of completely oxidized TiO2 films whereas XRD showed that the films contained a mixture of rutile and anatase phases with rutile being approximately 30% of the total volume. Two lamps, both of the same power but different wavelength range were employed as irradiation sources. Photocatalysis showed faster removal of 1,4-DCB as compared to direct photolysis. The complete degradation was attained using the freshly prepared TiO2 sample. The intermediate produced during the photocatalysis was benzoquinone. Photolysis using visible irradiation was relatively slower and both benzoquinone and hydroquinone were formed as intermediates. Higher initial degradation rates were observed when the same film was re-used, most probably due to the effect of washing of the TiO2 thin films surface with methanol.

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