Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
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This paper presents, for the first time, the different operating parameters defining the best depth resolution in SIMS organic analysis.
1996 ◽
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pp. 655-660
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2015 ◽
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pp. 2371-2374
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2011 ◽
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pp. 24535-24566
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pp. 732-733
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Vol 116
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