Label-free identification and characterization of living human primary and secondary tumour cells

Dimitrios Tsikritsis; Susanna Richmond; Patrick Stewart; Alistair Elfick; Andrew Downes

doi:10.1039/c5an00851d

Label-free identification and characterization of living human primary and secondary tumour cells

The Analyst ◽

10.1039/c5an00851d ◽

2015 ◽

Vol 140 (15) ◽

pp. 5162-5168 ◽

Cited By ~ 13

Author(s):

Dimitrios Tsikritsis ◽

Susanna Richmond ◽

Patrick Stewart ◽

Alistair Elfick ◽

Andrew Downes

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Tumour Cells ◽

Label Free ◽

Force Microscopy ◽

Atomic Force ◽

Secondary Tumour ◽

Identification And Characterization

Primary and secondary tumour cells exhibit biochemical differences (with Raman spectroscopy and imaging), and mechanical differences (with atomic force microscopy).

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Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

Journal of Applied Physics ◽

10.1063/1.357474 ◽

1994 ◽

Vol 76 (6) ◽

pp. 3443-3447 ◽

Cited By ~ 12

Author(s):

J. M. Yáñez‐Limón ◽

F. Ruiz ◽

J. González‐Hernández ◽

C. Vázquez‐López ◽

E. López‐Cruz

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Carbon Films ◽

Force Microscopy ◽

Atomic Force

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In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽

10.1021/nl3016347 ◽

2012 ◽

Vol 12 (8) ◽

pp. 4110-4116 ◽

Cited By ~ 13

Author(s):

P. T. Araujo ◽

N. M. Barbosa Neto ◽

H. Chacham ◽

S. S. Carara ◽

J. S. Soares ◽

...

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Multimodal Characterization of Resin Embedded and Sliced Polymer Nanoparticles by Means of Tip‐Enhanced Raman Spectroscopy and Force–Distance Curve Based Atomic Force Microscopy

Small ◽

10.1002/smll.201907418 ◽

2020 ◽

Vol 16 (17) ◽

pp. 1907418

Author(s):

Christiane Höppener ◽

Felix H. Schacher ◽

Volker Deckert

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Polymer Nanoparticles ◽

Distance Curve ◽

Force Microscopy ◽

Atomic Force ◽

Tip Enhanced Raman Spectroscopy

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Simultaneous Surface-Enhanced Raman Spectroscopy (SERS) and Atomic Force Microscopy (AFM) for Label-Free Physicochemical Analysis of Lipid Bilayers

Applied Spectroscopy ◽

10.1366/11-06319 ◽

2011 ◽

Vol 65 (12) ◽

pp. 1387-1392 ◽

Cited By ~ 15

Author(s):

Claire S. Sweetenham ◽

Marta Larraona-Puy ◽

Ioan Notingher

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Lipid Bilayers ◽

Surface Enhanced Raman Spectroscopy ◽

Physicochemical Analysis ◽

Label Free ◽

Force Microscopy ◽

Atomic Force ◽

Surface Enhanced ◽

Surface Enhanced Raman

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Characterization of synthetic membranes by Raman spectroscopy, electron spin resonance, and atomic force microscopy; a review

Polymer ◽

10.1016/s0032-3861(99)00359-6 ◽

2000 ◽

Vol 41 (5) ◽

pp. 1917-1935 ◽

Cited By ~ 86

Author(s):

K.C. Khulbe ◽

T. Matsuura

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Electron Spin Resonance ◽

Electron Spin ◽

Synthetic Membranes ◽

Force Microscopy ◽

Atomic Force ◽

Spin Resonance

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Characterization of HVPE GaN layers by atomic force microscopy and Raman spectroscopy

Semiconductor Science and Technology ◽

10.1088/0268-1242/16/9/307 ◽

2001 ◽

Vol 16 (9) ◽

pp. 776-782 ◽

Cited By ~ 7

Author(s):

R Fornari ◽

M Bosi ◽

D Bersani ◽

G Attolini ◽

P P Lottici ◽

...

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Characterization of diamond films deposited by hot-filament CVD using CF4 as doping gas by Raman spectroscopy, FTIR spectroscopy, and atomic force microscopy

10.1117/12.130764 ◽

1992 ◽

Cited By ~ 4

Author(s):

Vladimir J. Trava-Airoldi ◽

C. R. Rodrigues ◽

Masahiko Fukui ◽

Vitor Baranauskas

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Ftir Spectroscopy ◽

Diamond Films ◽

Force Microscopy ◽

As Doping ◽

Atomic Force ◽

Hot Filament Cvd ◽

Hot Filament

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Physical characterization of swine and human skin: Correlations between Raman spectroscopy, Tensile testing, Atomic force microscopy (AFM), Scanning electron microscopy (SEM), and Multiphoton microscopy (MPM)

Skin Research and Technology ◽

10.1111/srt.12976 ◽

2020 ◽

Author(s):

Pratima Labroo ◽

Jennifer Irvin ◽

Joshua Johnson ◽

Michael Sieverts ◽

James Miess ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Tensile Testing ◽

Multiphoton Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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The quantitative characterization of the dispersion state of single-walled carbon nanotubes using Raman spectroscopy and atomic force microscopy

Carbon ◽

10.1016/j.carbon.2008.06.046 ◽

2008 ◽

Vol 46 (12) ◽

pp. 1530-1534 ◽

Cited By ~ 21

Author(s):

Dokyung Yoon ◽

Jae-Boong Choi ◽

Chang-Soo Han ◽

Young-Jin Kim ◽

Seunghyun Baik

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Single Walled Carbon Nanotubes ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Dispersion State ◽

Walled Carbon Nanotubes

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Characterization of single transition metal oxide nanorods by combining atomic force microscopy and polarized micro-Raman spectroscopy

Chemical Physics Letters ◽

10.1016/j.cplett.2011.08.039 ◽

2011 ◽

Vol 514 (1-3) ◽

pp. 128-133 ◽

Cited By ~ 7

Author(s):

Samar Najjar ◽

David Talaga ◽

Yannick Coffinier ◽

Sabine Szunerits ◽

Rabah Boukherroub ◽

...

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Transition Metal ◽

Metal Oxide ◽

Force Microscopy ◽

Micro Raman Spectroscopy ◽

Atomic Force ◽

Oxide Nanorods ◽

Single Transition

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