scholarly journals Site-specific immobilization of DNA on silicon surfaces by using the thiol–yne reaction

2014 ◽  
Vol 2 (48) ◽  
pp. 8510-8517 ◽  
Author(s):  
Jorge Escorihuela ◽  
María-José Bañuls ◽  
Rosa Puchades ◽  
Ángel Maquieira

Covalent immobilization of ssDNA fragments onto silicon-based materials was performed using the thiol–yne reaction.

2019 ◽  
Vol 177 ◽  
pp. 506-511 ◽  
Author(s):  
Jing-Hong Wang ◽  
Ming-Ze Tang ◽  
Xiao-Tian Yu ◽  
Chong-Mei Xu ◽  
Hong-Ming Yang ◽  
...  

2005 ◽  
Vol 34 (2) ◽  
pp. 226-227 ◽  
Author(s):  
Bing Xia ◽  
Jun Li ◽  
Shou-Jun Xiao ◽  
Dong-Jie Guo ◽  
Jing Wang ◽  
...  

2005 ◽  
Vol 44 (8) ◽  
pp. 1254-1257 ◽  
Author(s):  
R. John Errington ◽  
Sagar S. Petkar ◽  
Benjamin R. Horrocks ◽  
Andrew Houlton ◽  
Lars H. Lie ◽  
...  

Langmuir ◽  
2020 ◽  
Vol 36 (10) ◽  
pp. 2740-2740
Author(s):  
Mingyang Li ◽  
Fang Cheng ◽  
Haoqiang Li ◽  
Weiwei Jin ◽  
Chen Chen ◽  
...  

Langmuir ◽  
2019 ◽  
Vol 35 (50) ◽  
pp. 16466-16475 ◽  
Author(s):  
Mingyang Li ◽  
Fang Cheng ◽  
Haoqiang Li ◽  
Weiwei Jin ◽  
Chen Chen ◽  
...  

1992 ◽  
Vol 262 ◽  
Author(s):  
R. K. Graupner ◽  
J. A. Van Vechten ◽  
P. Harwood ◽  
T. K. Monson

ABSTRACTWe propose a generalized model for gold diffusion in silicon based on the effect of the high concentrations of vacancies and vacancy complexes in the as-grown silicon. The monovacancy profiles calculated using this model are identical to the substitutional gold profiles calculated using the kick-out model. We deposited Au on commercial float zone Si in a vacuum system after the Si had reached the diffusion temperature (1233 K) and had been annealed in various ways. Contrary to previously published reports, we find the electrically active Au with a nearly one-sided profile when the Au is deposited on samples which were preannealed in vacuum. We conclude that annealed silicon surfaces lack the imperfections needed to make them effective sources or sinks for vacancies or self-interstitials. We propose that this can cause a high degree of supersaturation in the as-grown silicon crystal since the point defects cannot annihilate at the surfaces to maintain equilibrium as the crystal is cooled.


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