Formation chemistry of perovskites with mixed iodide/chloride content and the implications on charge transport properties

2015 ◽  
Vol 3 (17) ◽  
pp. 9081-9085 ◽  
Author(s):  
Tsz-Wai Ng ◽  
Chiu-Yee Chan ◽  
Ming-Fai Lo ◽  
Zhi Qiang Guan ◽  
Chun-Sing Lee

We study the formation chemistry of Cl-doped perovskites by examining the chemical interactions between thermally evaporated MAI and PbCl2through X-ray photoemission spectroscopy.

2017 ◽  
Vol 19 (9) ◽  
pp. 6721-6730 ◽  
Author(s):  
Marta Reig ◽  
Gintautas Bagdziunas ◽  
Dmytro Volyniuk ◽  
Juozas V. Grazulevicius ◽  
Dolores Velasco

The ambipolar charge transport properties of a series of push–pull carbazole-based semiconductors are here evaluated. The ambipolar characteristics depend on the supramolecular organization. Experimental results were confirmed and justified through the X-ray analysis of single crystals and by theoretical calculations.


2009 ◽  
Vol 105 (8) ◽  
pp. 083101 ◽  
Author(s):  
Y. Xu ◽  
P. J. Sellin ◽  
A. Lohstroh ◽  
W. Jie ◽  
T. Wang ◽  
...  

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


1990 ◽  
Author(s):  
Young K. Kim ◽  
David K. Shuh ◽  
R. S. Williams ◽  
Larry P. Sadwick ◽  
Kang L. Wang

2011 ◽  
Vol 41 (3) ◽  
pp. 524-529 ◽  
Author(s):  
Sushmita Biswas ◽  
David J. Gosztola ◽  
Gary P. Wiederrecht ◽  
Michael A. Stroscio ◽  
Mitra Dutta

2021 ◽  
Author(s):  
Jian Pei ◽  
Zi-Yuan Wang ◽  
Lucia Di Virgilio ◽  
Ze-Fan Yao ◽  
Zi-Di Yu ◽  
...  

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