Butterfly-scale architecture directed electrodeposition of Ag microband arrays for electrochemical detection

RSC Advances ◽  
2014 ◽  
Vol 4 (103) ◽  
pp. 59508-59512 ◽  
Author(s):  
Xingmei Guo ◽  
Tang Zhang ◽  
Jingwen Li ◽  
Tongxiang Fan
Keyword(s):  
Electric Field ◽  
Electrochemical Detection ◽  
Array Architecture ◽  
Troides Aeacus

The ridge array architecture of Troides aeacus butterfly scales was used as guidance to gather electric field compactly around the ridge tips to obtain an Ag microband array by electrodeposition.

Silver Nanograins with Pore-Array Architecture for the Electrochemical Detection of Hydrogen Peroxide

2017 ◽  
Vol 2 (29) ◽  
pp. 9438-9442 ◽  
Author(s):  
Xingmei Guo ◽  
Cheng Qian ◽  
Hongxun Yang ◽  
Shengling Lin ◽  
Tongxiang Fan
Keyword(s):  
Hydrogen Peroxide ◽  
Electrochemical Detection ◽  
Array Architecture

On-Chip Electric Field Driven Electrochemical Detection Using a Poly(dimethylsiloxane) Microchannel with Gold Microband Electrodes

2008 ◽  
Vol 80 (10) ◽  
pp. 3622-3632 ◽  
Author(s):  
Olga Ordeig ◽  
Neus Godino ◽  
Javier del Campo ◽  
Francesc Xavier Muñoz ◽  
Fredrik Nikolajeff ◽  
...  
Keyword(s):  
Electric Field ◽  
Electrochemical Detection ◽  
On Chip

In-Channel Electrochemical Detection in the Middle of Microchannel under High Electric Field

2011 ◽  
Vol 84 (2) ◽  
pp. 901-907 ◽  
Author(s):  
Chung Mu Kang ◽  
Segyeong Joo ◽  
Je Hyun Bae ◽  
Yang-Rae Kim ◽  
Yongseong Kim ◽  
...  
Keyword(s):  
Electric Field ◽  
Electrochemical Detection ◽  
High Electric Field

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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