In situ observations of Pt nanoparticles coalescing inside carbon nanotubes

RSC Advances ◽  
2014 ◽  
Vol 4 (90) ◽  
pp. 49442-49445 ◽  
Author(s):  
Magdalena Ola Cichocka ◽  
Jiong Zhao ◽  
Alicja Bachmatiuk ◽  
Huy Ta Quang ◽  
Sandeep M. Gorantla ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Transmission Electron Microscopy ◽  
Electron Irradiation ◽  
Pt Nanoparticles ◽  
Transmission Electron ◽  
In Situ Observations ◽  
Aberration Corrected

In this in situ study, details of the coalescence of Pt nanoparticles encapsulated within carbon nanotubes are investigated whilst under electron irradiation in aberration corrected transmission electron microscopy.

In-situ Observations of Restructuring Carbon Nanotubes via Low-voltage Aberration-corrected Transmission Electron Microscopy

2011 ◽  
Vol 1284 ◽  
Author(s):  
Felix Börrnert ◽  
Alicja Bachmatiuk ◽  
Sandeep Gorantla ◽  
Jamie H. Warner ◽  
Bernd Büchner ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Transmission Electron Microscopy ◽  
Carbon Nanostructures ◽  
Low Voltage ◽  
Single Wall Carbon Nanotubes ◽  
Structure And Dynamics ◽  
Transmission Electron ◽  
Aberration Corrected

ABSTRACTThe molecular structure and dynamics of carbon nanostructures is much discussed throughout the literature, mostly from the theoretical side because of a lack of suitable experimental techniques to adequately engage the problem. A technique that has recently become available is low-voltage aberration-corrected transmission electron microscopy. It is a valuable tool with which to directly observe the atomic structure and dynamics of the specimen in situ. Time series aberration-corrected low-voltage transmission electron microscopy is used to study the dynamics of single-wall carbon nanotubes in situ. We confirm experimentally previous theoretical predictions for the agglomeration of adatoms forming protrusions and subsequent removal. A model is proposed how lattice reconstruction sites spread. In addition, the complete healing of a multi-vacancy consisting of ca. 20 missing atoms in a nanotube wall is followed.

Progress in environmental high-voltage transmission electron microscopy for nanomaterials

2020 ◽  
Vol 378 (2186) ◽  
pp. 20190602
Author(s):  
Nobuo Tanaka ◽  
Takeshi Fujita ◽  
Yoshimasa Takahashi ◽  
Jun Yamasaki ◽  
Kazuyoshi Murata ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Voltage ◽  
High Energy ◽  
Transmission Electron ◽  
Recent Developments ◽  
In Situ Observations ◽  
High Voltage Transmission ◽  
And Function

A new environmental high-voltage transmission electron microscope (E-HVEM) was developed by Nagoya University in collaboration with JEOL Ltd. An open-type environmental cell was employed to enable in-situ observations of chemical reactions on catalyst particles as well as mechanical deformation in gaseous conditions. One of the reasons for success was the application of high-voltage transmission electron microscopy to environmental (in-situ) observations in the gas atmosphere because of high transmission of electrons through gas layers and thick samples. Knock-on damages to samples by high-energy electrons were carefully considered. In this paper, we describe the detailed design of the E-HVEM, recent developments and various applications. This article is part of a discussion meeting issue ‘Dynamic in situ microscopy relating structure and function'.

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