Recombination kinetics in a silicon solar cell at low concentration: electro-analytical characterization of space-charge and quasi-neutral regions

2014 ◽  
Vol 16 (29) ◽  
pp. 15469-15476 ◽  
Author(s):  
Pankaj Yadav ◽  
Brijesh Tripathi ◽  
Kavita Pandey ◽  
Manoj Kumar

We carried out electro-analytical measurements to demonstrate the characteristic features of charge recombination in the space-charge region and the quasi-neutral region.

2014 ◽  
Vol 7 (12) ◽  
pp. 2554-2558 ◽  
Author(s):  
Ali Moissi ◽  
Martial Zoungrana ◽  
Abdourrahmane Diallo ◽  
Senghane Mbodji ◽  
Hawa Ly Diallo ◽  
...  

2018 ◽  
Vol 63 (1) ◽  
pp. 38
Author(s):  
A. V. Kozinetz ◽  
V. A. Skryshevsky

The insertion of a thin amorphized layer (AL) in the space charge region of a silicon solar cell is proposed as a way to improve the conversion efficiency due to the impurity photovoltaic effect. Previously, this approach had been applied to a cell with a layer inserted in the emitter by the ion implantation. The insertion of such layer in the space charge region is founded to be preferable, because a better control over the recombination (via energy levels in the band gap and local states of interfaces) can be achieved. The parameters of a modified device are investigated by the numerical simulation, and it is concluded that the layer parameters have a crucial influence on the cell conversion efficiency. Based on our simulation results, the optimal AL and the height of barriers are determined. In such a case, the short circuit current density is improved due to the absorption of photons with energy less than a silicon band gap of 1.12 eV in AL, whereas the open circuit voltage and fill factor remain unchanged. Theoretically, the increase in the efficiency by 1–2% is achievable. In the non-optimal case, the degradation of a short circuit current and the fill factor eliminate the positive effect of an additional photogeneration in AL.


2021 ◽  
Vol 13 (01) ◽  
pp. 41-50
Author(s):  
Bernard Zouma ◽  
Fabé Idrissa Barro ◽  
Prince Abdoul Aziz Honadia

2006 ◽  
Vol 45 (5A) ◽  
pp. 3933-3937 ◽  
Author(s):  
Satoshi Omae ◽  
Takashi Minemoto ◽  
Mikio Murozono ◽  
Hideyuki Takakura ◽  
Yoshihiro Hamakawa

2012 ◽  
Vol 195 ◽  
pp. 301-304 ◽  
Author(s):  
Heike Angermann ◽  
U. Stürzebecher ◽  
J. Kegel ◽  
C. Gottschalk ◽  
K. Wolke ◽  
...  

For further enhancement of solar energy conversion efficiency the passivation of silicon (Si) substrate surfaces and interfaces of Si-based solar cell devices is a decisive precondition to reduce recombination losses of photogenerated charge carriers. These losses are mainly controlled by surface charges, the density and the character of rechargeable interface states (Dit) [], which are induced by defects localised in a small interlayer extending over only few Å. Therefore, the application of fast non-destructive methods for characterization of the electronic interface properties directly during the technological process has received an increasing interest in recent years.


Author(s):  
Khorshed Alam ◽  
Tanisha Mehreen ◽  
Mohammad Khairul Basher ◽  
Mohammod Abu Sayid Haque ◽  
Subir C. Ghosh ◽  
...  

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