A polydopamine layer as the nucleation center of MOF deposition on “inert” polymer surfaces to fabricate hierarchically structured porous films

2015 ◽  
Vol 51 (13) ◽  
pp. 2706-2709 ◽  
Author(s):  
Meimei Zhou ◽  
Jian Li ◽  
Meng Zhang ◽  
Hui Wang ◽  
Yue Lan ◽  
...  
Keyword(s):  
Polymer Membranes ◽  
Polymer Surfaces ◽  
Nucleation Center ◽  
Porous Films ◽  
Inert Polymer

Polydopamine could be used as an effective nucleation center for MOF deposition on “inert” polymer membranes, affording hierarchically structured porous films.

Multipurpose Polymeric Coating for Functionalizing Inert Polymer Surfaces

2016 ◽  
Vol 8 (8) ◽  
pp. 5694-5705 ◽  
Author(s):  
A. Evren Özçam ◽  
Kirill Efimenko ◽  
Richard J. Spontak ◽  
Daniel A. Fischer ◽  
Jan Genzer
Keyword(s):  
Polymer Surfaces ◽  
Polymeric Coating ◽  
Inert Polymer

COVALENT BINDING OF BIOMOLECULES TO RADIATION-GRAFTED HYDROGELS ON INERT POLYMER SURFACES

ASAIO Journal ◽  
1972 ◽  
Vol 18 (1) ◽  
pp. 10-16 ◽  
Author(s):  
A. S. Hoffman ◽  
G. Schmer ◽  
C. Harris ◽  
W. G. Kraft
Keyword(s):  
Covalent Binding ◽  
Polymer Surfaces ◽  
Inert Polymer

Enabling Organosilicon Chemistries on Inert Polymer Surfaces with a Vapor-Deposited Silica Layer

Langmuir ◽  
2009 ◽  
Vol 25 (19) ◽  
pp. 11541-11548 ◽  
Author(s):  
A. Anderson ◽  
W. R. Ashurst
Keyword(s):  
Polymer Surfaces ◽  
Silica Layer ◽  
Inert Polymer

On-Film Annealing: A Simple Method to Fabricate Heterogeneous Polymer Surfaces, Porous Films, and Hemispheres

2015 ◽  
Vol 4 (7) ◽  
pp. 721-724 ◽  
Author(s):  
Jiun-Tai Chen ◽  
Po-Hsi Lee ◽  
Hsiao-Fan Tseng ◽  
Yu-Jing Chiu ◽  
Yi-Huei Kao ◽  
...  
Keyword(s):  
Polymer Surfaces ◽  
Porous Films ◽  
Simple Method ◽  
Heterogeneous Polymer ◽  
Film Annealing

Enhanced contrast SEI/TEM of polymer membranes

1984 ◽  
Vol 42 ◽  
pp. 384-385
Author(s):  
L. C. Sawyer
Keyword(s):  
Cross Sections ◽  
Three Dimensional ◽  
Polymer Membranes ◽  
Structure Characterization ◽  
Dimensional Structure ◽  
Specimen Preparation ◽  
Porous Films ◽  
Transmission Electron ◽  
Electron Imaging

Specimen preparation for the characterization of polymers requires special handling to ensure that the in situ structures are observed. In the case of polymer membranes the situation is more difficult than usual as these thin, porous films are delicate and may collapse upon drying. Standard embedding and microtomy are often not possible due to this soft, collapsable texture. When microtomy is successful the resulting sections usually exhibit poor contrast due to their low atomic number. Scanning electron microsopy (SEM) of fractured cross-sections often reveals collapsed textures. Surface analysis also has limited resolution. The subject of this paper is to describe the enhanced contrast methods developed for both the secondary electron imaging (SEI) and transmission electron microscopy (TEM) of polymer membranes for three dimensional structure characterization.

Effects of Electrical Discharges in Low Pressure Gases on the Morphology of Polyethylene Crystals

1974 ◽  
Vol 32 ◽  
pp. 544-545
Author(s):  
L.H. Bolz ◽  
D.H. Reneker
Keyword(s):  
Power Distribution ◽  
Electrical Discharge ◽  
Dielectric Breakdown ◽  
Ionic Species ◽  
Low Pressure ◽  
Polymer Surfaces ◽  
Electrical Discharges ◽  
Adhesive Bonds ◽  
Power Distribution Lines ◽  
Modification Of The Surface

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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