A facile fabrication process for polystyrene nanoring arrays

Nanoscale ◽  
2013 ◽  
Vol 5 (22) ◽  
pp. 11071 ◽  
Author(s):  
Zuzanna A. Lewicka ◽  
Arash Bahloul ◽  
William W. Yu ◽  
Vicki L. Colvin
2011 ◽  
Vol 131 (1-2) ◽  
pp. 136-141 ◽  
Author(s):  
Weiwei Zhang ◽  
Liqing Huang ◽  
Jian Zhu ◽  
You Liu ◽  
Jun Wang

RSC Advances ◽  
2016 ◽  
Vol 6 (60) ◽  
pp. 54976-54983 ◽  
Author(s):  
Chen Ding ◽  
Jian-Chen Hu ◽  
Wei Yuan ◽  
De-Zhuang Du ◽  
Ya Yang ◽  
...  

A facile fabrication process for centimeter-scale colloidal photonic crystal stripe is developed through self-assembling polymer microspheres and silica colloidal nanoparticles. With the aid of sintering, porous-ordered microstructure forms.


ACS Omega ◽  
2019 ◽  
Vol 4 (22) ◽  
pp. 19840-19846
Author(s):  
Juan Rombaut ◽  
Manuel Fernandez ◽  
Prantik Mazumder ◽  
Valerio Pruneri

2013 ◽  
Vol 06 (06) ◽  
pp. 1350051
Author(s):  
YUN WEI ◽  
HAO PAN ◽  
JIESHU QIAN ◽  
XINGFU ZHOU

A general anisotropic etching strategy is proposed here for the synthesis of four types of novel TiO 2 materials with versatile tube-like and single-crystalline mesoporous micro-nanostructures. All the tube-like TiO 2 materials have V-shaped inner structure and the mesoporous products have high single-crystallinity. In the fabrication process, etching agents and titanium sources play vital role in determining the morphology of the TiO 2 products. This opens a door toward facile fabrication of tube-like or single-crystalline mesoporous nanomaterials via anisotropic etching route.


Author(s):  
M.G. Rosenfield

Minimum feature sizes in experimental integrated circuits are approaching 0.5 μm and below. During the fabrication process it is usually necessary to be able to non-destructively measure the critical dimensions in resist and after the various process steps. This can be accomplished using the low voltage SEM. Submicron linewidth measurement is typically done by manually measuring the SEM micrographs. Since it is desirable to make as many measurements as possible in the shortest period of time, it is important that this technique be automated.Linewidth measurement using the scanning electron microscope is not well understood. The basic intent is to measure the size of a structure from the secondary electron signal generated by that structure. Thus, it is important to understand how the actual dimension of the line being measured relates to the secondary electron signal. Since different features generate different signals, the same method of relating linewidth to signal cannot be used. For example, the peak to peak method may be used to accurately measure the linewidth of an isolated resist line; but, a threshold technique may be required for an isolated space in resist.


2019 ◽  
Vol 14 (4) ◽  
pp. 349-352
Author(s):  
Xiaohai Bu ◽  
Dongxian Li ◽  
Zewu Zhang ◽  
Chaofeng Hong ◽  
Li Zhang ◽  
...  
Keyword(s):  

Author(s):  
Noriyuki Nomoto ◽  
Yoshitomi Okazaki ◽  
Kenji Kuroda ◽  
Shunji Takenoiri ◽  
Toyonobu Yoshida

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