Atomic force microscopy and near-field optical imaging of a spin transition

Nanoscale ◽  
2013 ◽  
Vol 5 (17) ◽  
pp. 7762 ◽  
Author(s):  
Manuel Lopes ◽  
Carlos M. Quintero ◽  
Edna M. Hernández ◽  
Víctor Velázquez ◽  
Carlos Bartual-Murgui ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Imaging ◽  
Near Field ◽  
Spin Transition ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

2003 ◽  
Vol 97 (1-4) ◽  
pp. 81-87 ◽  
Author(s):  
Tomoyuki Yoshino ◽  
Shigeru Sugiyama ◽  
Shoji Hagiwara ◽  
Daisuke Fukushi ◽  
Motoharu Shichiri ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force

Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB04 ◽  
Author(s):  
Nobuo Satoh ◽  
Kei Kobayashi ◽  
Shunji Watanabe ◽  
Toru Fujii ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoelectric Cantilever ◽  
Mechanical Detection

Atomic force microscopy imaging using a tip-on-chip: Opening the door to integrated near field nanotools

2010 ◽  
Vol 81 (9) ◽  
pp. 093707 ◽  
Author(s):  
J. Hayton ◽  
J. Polesel-Maris ◽  
R. Demadrille ◽  
M. Brun ◽  
F. Thoyer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
On Chip

scholarly journals Imaging of Chromosomes at Nano-Meter Scale Resolution Using Scanning Near-Field Optical/Atomic Force Microscopy.

2002 ◽  
Vol 65 (5) ◽  
pp. 425-434 ◽  
Author(s):  
Toshio OHTANI ◽  
Motoharu SHICHIRI ◽  
Daisuke FUKUSHI ◽  
Shigeru SUGIYAMA ◽  
Tomoyuki YOSHINO ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force
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