scholarly journals Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects

2013 ◽  
Vol 28 (5) ◽  
pp. 689 ◽  
Author(s):  
Stanisław H. Nowak ◽  
Falk Reinhardt ◽  
Burkhard Beckhoff ◽  
Jean-Claude Dousse ◽  
Jakub Szlachetko
Keyword(s):  
Grazing Incidence ◽  
Geometrical Optics ◽  
X Ray

Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778

2015 ◽  
Vol 30 (12) ◽  
pp. 2548-2550
Author(s):  
W. Jark ◽  
D. Eichert
Keyword(s):  
Physical Model ◽  
Periodic Structures ◽  
Standing Waves ◽  
Grazing Incidence ◽  
Data Interpretation ◽  
Geometrical Optics ◽  
X Ray ◽  
Model Based ◽  
Published Paper

The data interpretation in the recently published paper with the above title is criticized and it is shown that an alternative more physical model based on diffraction in periodic structures can explain the data better and more consistently.

Reply to the Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations”

2015 ◽  
Vol 30 (12) ◽  
pp. 2551-2553
Author(s):  
Stanisław H. Nowak ◽  
Burkhard Beckhoff ◽  
Falk Reinhardt ◽  
Jean-Claude Dousse
Keyword(s):  
Periodic Structures ◽  
Standing Waves ◽  
Grazing Incidence ◽  
Data Interpretation ◽  
Geometrical Optics ◽  
X Ray

We respond to the comment by W. Jark and D. Eichert on our earlier article concerning geometrical optics based data interpretation of grazing incidence X-ray fluorescence experiments.

scholarly journals Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations

2014 ◽  
Vol 29 (10) ◽  
pp. 1778-1784 ◽  
Author(s):  
Falk Reinhardt ◽  
Stanisław H. Nowak ◽  
Burkhard Beckhoff ◽  
Jean-Claude Dousse ◽  
Max Schoengen
Keyword(s):  
Periodic Structures ◽  
Standing Waves ◽  
Grazing Incidence ◽  
Geometrical Optics ◽  
X Ray

Geometrical optics calculations are able to reproduce experimentally found modulations in GIXRF which are beyond the potential of the XSW model.

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

X-Ray Fluorescence Spectrometer with Geometry of Grazing Incidence X-ray Radiation

2012 ◽  
Vol 1 (2) ◽  
pp. 78-82
Author(s):  
N.M. Novikovskii ◽  
◽  
V.M. Raznomazov ◽  
V.O. Ponomarenko ◽  
D.A. Sarychev ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray ◽  
Fluorescence Spectrometer

Quantifying Multiple Crystallite Orientations and Crystal Heterogeneities in Complex Thin Film Materials

2019 ◽  
Author(s):  
Jonathan Ogle ◽  
Daniel Powell ◽  
Eric Amerling ◽  
Detlef Matthias Smilgies ◽  
Luisa Whittaker-Brooks
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Design ◽  
Grazing Incidence ◽  
Crystallite Orientation ◽  
Miller Index ◽  
X Ray ◽  
X Ray Scattering ◽  
Orientation Distributions ◽  
Orientation Information

<p>Thin film materials have become increasingly complex in morphological and structural design. When characterizing the structure of these films, a crucial field of study is the role that crystallite orientation plays in giving rise to unique electronic properties. It is therefore important to have a comparative tool for understanding differences in crystallite orientation within a thin film, and also the ability to compare the structural orientation between different thin films. Herein, we designed a new method dubbed the mosaicity factor (MF) to quantify crystallite orientation in thin films using grazing incidence wide-angle X-ray scattering (GIWAXS) patterns. This method for quantifying the orientation of thin films overcomes many limitations inherent in previous approaches such as noise sensitivity, the ability to compare orientation distributions along different axes, and the ability to quantify multiple crystallite orientations observed within the same Miller index. Following the presentation of MF, we proceed to discussing case studies to show the efficacy and range of application available for the use of MF. These studies show how using the MF approach yields quantitative orientation information for various materials assembled on a substrate.<b></b></p>

Strain Relaxation and In-Situ Observation of Voiding in Passivated Aluminum Alloy Lines.

1993 ◽  
Vol 308 ◽  
Author(s):  
Paul R. Besser ◽  
Thomas N. Marieb ◽  
John C. Bravman
Keyword(s):  
Strain Relaxation ◽  
Grazing Incidence ◽  
Scanning Transmission Electron Microscope ◽  
In Situ Observation ◽  
X Ray ◽  
Scanning Transmission ◽  
Length Width ◽  
Measured Strain ◽  
Ray Geometry

ABSTRACTStrain relaxation in passivated Al-0.5% Cu lines was measured using X-ray diffraction coupled with in-situ observation of the formation and growth of stress induced voids. Samples of 1 μm thick Al-0.5% Cu lines passivated with Si3N4 were heated to 380ºC, then cooled and held at 150ºC. During the test, principal strains along the length, width, and height of the line were determined using a grazing incidence x-ray geometry. From these measurements the hydrostatic strain in the metal was calculated and strain relaxation was observed. The thermal cycle was duplicated in a high voltage scanning transmission electron microscope equipped with a backscattered electron detector. The 1.25 μm wide lines were seen to have initial stress voids. Upon heating these voids reduced in size until no longer observable. Once the samples were cooled to 150ºC, voids reappeared and grew. The measured strain relaxation is discussed in terms of void and θ-phase (Al2Cu) formation.

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