Infrared and reflectron time-of-flight mass spectroscopic analysis of methane (CH4)–carbon monoxide (CO) ices exposed to ionization radiation – toward the formation of carbonyl-bearing molecules in extraterrestrial ices

2014 ◽  
Vol 16 (8) ◽  
pp. 3399-3424 ◽  
Author(s):  
Ralf I. Kaiser ◽  
Surajit Maity ◽  
Brant M. Jones
Keyword(s):  
Carbon Monoxide ◽  
Spectroscopic Analysis ◽  
Time Of Flight ◽  
Ionization Radiation

Time‐of‐flight measurements of single rovibrational states of carbon monoxide

1992 ◽  
Vol 96 (3) ◽  
pp. 1854-1857 ◽  
Author(s):  
J. M. Price ◽  
A. Ludviksson ◽  
M. Nooney ◽  
M. Xu ◽  
R. M. Martin ◽  
...  
Keyword(s):  
Carbon Monoxide ◽  
Time Of Flight ◽  
Rovibrational States ◽  
Flight Measurements

Spectroscopic analysis of multicomponent gas mixtures with wide range carbon monoxide laser

2010 ◽  
Author(s):  
E. Yu. Bondarchuk ◽  
A. A. Ionin ◽  
A. Yu. Kozlov ◽  
Yu. M. Klimachev ◽  
A. A. Kotkov ◽  
...  
Keyword(s):  
Carbon Monoxide ◽  
Spectroscopic Analysis ◽  
Gas Mixtures ◽  
Wide Range ◽  
Multicomponent Gas

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Sign in / Sign up

Export Citation Format

Share Document