Structural analysis of cured phenolic resins using complementary small-angle neutron and X-ray scattering and scanning electron microscopy

Soft Matter ◽  
2012 ◽  
Vol 8 (32) ◽  
pp. 8438 ◽  
Author(s):  
Atsushi Izumi ◽  
Toshio Nakao ◽  
Hiroki Iwase ◽  
Mitsuhiro Shibayama
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Structural Analysis ◽  
Small Angle ◽  
Phenolic Resins ◽  
X Ray ◽  
X Ray Scattering ◽  
Scanning Electron ◽  
Ray Scattering

Percolation behaviors of model carbon black pastes

Soft Matter ◽  
2018 ◽  
Vol 14 (48) ◽  
pp. 9786-9797 ◽  
Author(s):  
Jung-Shiun Jiang ◽  
Rong-Hao Guo ◽  
Yu-Shuen Chiu ◽  
Chi-Chung Hua
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Carbon Black ◽  
Small Angle ◽  
Ethyl Cellulose ◽  
Impedance Spectra ◽  
X Ray ◽  
X Ray Scattering ◽  
Scanning Electron ◽  
Ray Scattering

The percolation behaviors of a series of high-structured carbon black (CB) pastes (CB weight fractions 10–25 wt%, ethyl cellulose as the binder, α-terpineol as the solvent) were systematically investigated using analyses of rheology and impedance spectra together with characterization via small-angle X-ray scattering (SAXS) and scanning electron microscopy (SEM).

Nanostructure of the neurocentral growth plate: Insight from scanning small angle X-ray scattering, atomic force microscopy and scanning electron microscopy

Bone ◽  
2006 ◽  
Vol 39 (3) ◽  
pp. 530-541 ◽  
Author(s):  
Mathias Hauge Bünger ◽  
Morten Foss ◽  
Kurt Erlacher ◽  
Mads Bruun Hovgaard ◽  
Jacques Chevallier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Growth Plate ◽  
Small Angle ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Scanning Electron

Structural Analysis of Polysaccharide Networks by Transmission Electron Microscopy: Comparison with Small-Angle X-ray Scattering

2018 ◽  
Vol 19 (3) ◽  
pp. 989-995 ◽  
Author(s):  
Pablo Hernandez-Cerdan ◽  
Bradley W. Mansel ◽  
Andrew Leis ◽  
Leif Lundin ◽  
Martin A.K. Williams
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Analysis ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Ray Scattering

Equilibrium, FTIR, scanning electron microscopy and small wide angle X-ray scattering studies of chromates adsorption on modified bentonite

2005 ◽  
Vol 740 (1-3) ◽  
pp. 203-211 ◽  
Author(s):  
Marek Majdan ◽  
Oksana Maryuk ◽  
Stanisław Pikus ◽  
Elzbieta Olszewska ◽  
Ryszard Kwiatkowski ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Wide Angle ◽  
Modified Bentonite ◽  
X Ray ◽  
X Ray Scattering ◽  
Scanning Electron ◽  
Ray Scattering
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