scholarly journals Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

2012 ◽  
Vol 27 (9) ◽  
pp. 1432 ◽  
Author(s):  
P. Hönicke ◽  
Y. Kayser ◽  
B. Beckhoff ◽  
M. Müller ◽  
J.-Cl. Dousse ◽  
...  
Keyword(s):  
Fluorescence Spectroscopy ◽  
Grazing Incidence ◽  
X Ray

Suitability of the Compton-to-Rayleigh ratio in X-ray fluorescence spectroscopy: hydroxyapatite-based materials characterization

2019 ◽  
Vol 34 (5) ◽  
pp. 854-859 ◽  
Author(s):  
Sofia Pessanha ◽  
Sara Silva ◽  
Luís Martins ◽  
José Paulo Santos ◽  
João M. Silveira
Keyword(s):  
Fluorescence Spectroscopy ◽  
Materials Characterization ◽  
X Ray

In this work, we established a methodology for the analysis and characterization of hydroxyapatite-based materials using X-ray fluorescence.

Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

2015 ◽  
Vol 212 (3) ◽  
pp. 523-528 ◽  
Author(s):  
Philipp Hönicke ◽  
Blanka Detlefs ◽  
Matthias Müller ◽  
Erik Darlatt ◽  
Emmanuel Nolot ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
X Ray ◽  
Gradient Systems

The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays

2009 ◽  
Vol 24 (6) ◽  
pp. 792 ◽  
Author(s):  
Alex von Bohlen ◽  
Markus Krämer ◽  
Christian Sternemann ◽  
Michael Paulus
Keyword(s):  
Coherence Length ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray

Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction

1991 ◽  
Vol 79 (11) ◽  
pp. 923-928 ◽  
Author(s):  
A. Bensaid ◽  
G. Patrat ◽  
M. Brunel ◽  
F. de Bergevin ◽  
R. Hérino
Keyword(s):  
Porous Silicon ◽  
Grazing Incidence ◽  
X Ray
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