Self-aligned integration of native cellulose nanofibrils towards producing diverse bulk materials

Soft Matter ◽  
2011 ◽  
Vol 7 (19) ◽  
pp. 8804 ◽  
Author(s):  
Tsuguyuki Saito ◽  
Takehiko Uematsu ◽  
Satoshi Kimura ◽  
Toshiharu Enomae ◽  
Akira Isogai
2014 ◽  
Vol 104 ◽  
pp. 143-150 ◽  
Author(s):  
Jiangqi Zhao ◽  
Xu He ◽  
Yaru Wang ◽  
Wei Zhang ◽  
Xinxing Zhang ◽  
...  

Langmuir ◽  
2008 ◽  
Vol 24 (20) ◽  
pp. 11592-11599 ◽  
Author(s):  
S. Ahola ◽  
X. Turon ◽  
M. Österberg ◽  
J. Laine ◽  
O. J. Rojas

2011 ◽  
Vol 12 (6) ◽  
pp. 2074-2081 ◽  
Author(s):  
Miao Wang ◽  
Anna Olszewska ◽  
Andreas Walther ◽  
Jani-Markus Malho ◽  
Felix H. Schacher ◽  
...  

2011 ◽  
Vol 23 (26) ◽  
pp. 2924-2928 ◽  
Author(s):  
Andreas Walther ◽  
Jaakko V. I. Timonen ◽  
Isabel Díez ◽  
Antti Laukkanen ◽  
Olli Ikkala

2020 ◽  
Vol 6 (19) ◽  
pp. eaaz7328 ◽  
Author(s):  
B. D. Mattos ◽  
B. L. Tardy ◽  
L. G. Greca ◽  
T. Kämäräinen ◽  
W. Xiang ◽  
...  

Superstructured colloidal materials exploit the synergies between components to develop new or enhanced functions. Cohesion is a primary requirement for scaling up these assemblies into bulk materials, and it has only been fulfilled in case-specific bases. Here, we demonstrate that the topology of nanonetworks formed from cellulose nanofibrils (CNFs) enables robust superstructuring with virtually any particle. An intermixed network of fibrils with particles increases the toughness of the assemblies by up to three orders of magnitude compared, for instance, to sintering. Supramolecular cohesion is transferred from the fibrils to the constructs following a power law, with a constant decay factor for particle sizes from 230 nm to 40 μm. Our findings are applicable to other nanofiber dimensions via a rationalization of the morphological aspects of both particles and nanofibers. CNF-based cohesion will move developments of functional colloids from laboratory-scale toward their implementation in large-scale nanomanufacturing of bulk materials.


2008 ◽  
Vol 9 (4) ◽  
pp. 1273-1282 ◽  
Author(s):  
S. Ahola ◽  
J. Salmi ◽  
L.-S. Johansson ◽  
J. Laine ◽  
M. Österberg

2013 ◽  
Vol 14 (12) ◽  
pp. 4497-4506 ◽  
Author(s):  
Alejandro J. Benítez ◽  
Jose Torres-Rendon ◽  
Mikko Poutanen ◽  
Andreas Walther

Author(s):  
Robert M. Fisher

By 1940, a half dozen or so commercial or home-built transmission electron microscopes were in use for studies of the ultrastructure of matter. These operated at 30-60 kV and most pioneering microscopists were preoccupied with their search for electron transparent substrates to support dispersions of particulates or bacteria for TEM examination and did not contemplate studies of bulk materials. Metallurgist H. Mahl and other physical scientists, accustomed to examining etched, deformed or machined specimens by reflected light in the optical microscope, were also highly motivated to capitalize on the superior resolution of the electron microscope. Mahl originated several methods of preparing thin oxide or lacquer impressions of surfaces that were transparent in his 50 kV TEM. The utility of replication was recognized immediately and many variations on the theme, including two-step negative-positive replicas, soon appeared. Intense development of replica techniques slowed after 1955 but important advances still occur. The availability of 100 kV instruments, advent of thin film methods for metals and ceramics and microtoming of thin sections for biological specimens largely eliminated any need to resort to replicas.


Author(s):  
Daniel UGARTE

Small particles exhibit chemical and physical behaviors substantially different from bulk materials. This is due to the fact that boundary conditions can induce specific constraints on the observed properties. As an example, energy loss experiments carried out in an analytical electron microscope, constitute a powerful technique to investigate the excitation of collective surface modes (plasmons), which are modified in a limited size medium. In this work a STEM VG HB501 has been used to study the low energy loss spectrum (1-40 eV) of silicon spherical particles [1], and the spatial localization of the different modes has been analyzed through digitally acquired energy filtered images. This material and its oxides have been extensively studied and are very well characterized, because of their applications in microelectronics. These particles are thus ideal objects to test the validity of theories developed up to now.Typical EELS spectra in the low loss region are shown in fig. 2 and energy filtered images for the main spectral features in fig. 3.


Sign in / Sign up

Export Citation Format

Share Document