Observations on PVP-protected noble metallic nanoparticle deposits upon heating via in situ synchrotron radiation X-ray diffraction

2011 ◽  
Vol 13 (11) ◽  
pp. 5099 ◽  
Author(s):  
Jenn-Ming Song ◽  
Guan-Di Chiou ◽  
Wei-Ting Chen ◽  
Shih-Yun Chen ◽  
Tzu-Hsuan Kao ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
X Ray Diffraction ◽  
Metallic Nanoparticle ◽  
X Ray

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

scholarly journals In-situhigh-pressure powder X-ray diffraction study of α-zirconium phosphate

2014 ◽  
Vol 70 (3) ◽  
pp. 510-516
Author(s):  
Jennifer E. Readman ◽  
Alistair Lennie ◽  
Joseph A. Hriljac
Keyword(s):  
High Pressure ◽  
Synchrotron Radiation ◽  
Zirconium Phosphate ◽  
Water Molecules ◽  
X Ray Diffraction ◽  
X Ray ◽  
Additional Water ◽  
Diffraction Patterns ◽  
Layered Phosphate

The high-pressure structural chemistry of α-zirconium phosphate, α-Zr(HPO4)2·H2O, was studied usingin-situhigh-pressure diffraction and synchrotron radiation. The layered phosphate was studied under both hydrostatic and non-hydrostatic conditions and Rietveld refinement carried out on the resulting diffraction patterns. It was found that under hydrostatic conditions no uptake of additional water molecules from the pressure-transmitting medium occurred, contrary to what had previously been observed with some zeolite materials and a layered titanium phosphate. Under hydrostatic conditions the sample remained crystalline up to 10 GPa, but under non-hydrostatic conditions the sample amorphized between 7.3 and 9.5 GPa. The calculated bulk modulus,K0= 15.2 GPa, showed the material to be very compressible with the weak linkages in the structure of the type Zr—O—P.

scholarly journals Formation of Delta Ferrite in 9 Wt Pct Cr Steel Investigated by In-Situ X-Ray Diffraction Using Synchrotron Radiation

2010 ◽  
Vol 41 (10) ◽  
pp. 2462-2465 ◽  
Author(s):  
P. Mayr ◽  
T.A. Palmer ◽  
J.W. Elmer ◽  
E.D. Specht ◽  
S.M. Allen
Keyword(s):  
Synchrotron Radiation ◽  
X Ray Diffraction ◽  
Delta Ferrite ◽  
X Ray

Copper Sulfide Assisted Recrystallization of Cu-poor CuInS2 Observed in-situ by Polychromatic X-ray Diffraction

2009 ◽  
Vol 1165 ◽  
Author(s):  
Humberto Rodriguez-Alvarez ◽  
R. Mainz ◽  
A. Weber ◽  
B. Marsen ◽  
H.W. Schock
Keyword(s):  
Synchrotron Radiation ◽  
Copper Sulfide ◽  
S Phase ◽  
Intensity Increase ◽  
Cauchy Type ◽  
X Ray Diffraction ◽  
Sulfur Pressure ◽  
X Ray ◽  
Gauss Type

AbstractThe microstructural changes during heating of bi-layers of Cu-poor CuInS2 and CuS under different sulfur excess conditions were studied. This was done by means of energy dispersive X-ray diffraction of polychromatic synchrotron radiation in a vacuum setup where the sulfur pressure conditions can be controlled. Understood as the formation of a new microstructure, the recrystallization of the Cu-poor CuInS2 phase was characterized by a change in the reflection profile (from Cauchy-type to Gauss-type), the reduction of the breadth and a subsequent normalized-intensity increase of the 112 reflection. The Cauchy component of the breadth was used to monitor the recrystallization under different sulfur and heating rate conditions. The main results are: a) Cu availability for the consumption of the CuIn5S8 phase is a pre-requisite for recrystallization, b) in presence of the Cu2-xS phase, increased sulfur pressure enhances recrystallization.

Synchrotron radiation X-ray diffraction analysis for Bi-based oxide superconducting wire

2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
S. Uemura ◽  
J. Iihara ◽  
Y. Saito ◽  
K. Yamaguchi ◽  
J. Matsumoto ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Diffraction Analysis ◽  
Crystal Orientation ◽  
Power Transmission ◽  
Process Conditions ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Superconducting Wire

The Bi-based oxide superconducting wire is one of the most promising materials for practical uses such as electric power transmission, electromagnets and so on. For the higher performances required in these applications, it is necessary to increase the critical current (Ic). We have carried out synchrotron radiation X-ray diffraction analysis to improve our manufacturing processes and thus to achieve higher Ic. We have performed in situ X-ray diffraction measurements during the sintering and cooling processes, and observed the decrease of Bi-2223(=(Bi,Pb)2Sr2Ca2Cu3Ox) phase during the cooling process. We have also evaluated the distribution of the crystal orientation in whole wire thickness, by measuring the rocking curves. We have observed that the distribution of the crystal orientation is improved by a refinement of the process conditions.

Synchrotron radiation in situ X-ray absorption fine structure and in situ X-ray diffraction analysis of a high-performance cobalt catalyst towards the oxygen reduction reaction

2017 ◽  
Vol 19 (45) ◽  
pp. 30749-30755
Author(s):  
Haiying Qin ◽  
Longxia Lin ◽  
Junkang Jia ◽  
Huangliang Ni ◽  
Yan He ◽  
...  
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
Diffraction Analysis ◽  
High Performance ◽  
Cobalt Catalyst ◽  
Reduction Reaction ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

The evolution of metallic Co to Co(OH)2 and then to CoOOH during the ORR was revealed by in situ XRD combined with in situ XAFS tests.

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