Shape-controlled growth and single-crystal XRD study of submillimeter-sized single crystals of SnO

CrystEngComm ◽  
2011 ◽  
Vol 13 (19) ◽  
pp. 5677 ◽  
Author(s):  
Y. Q. Guo ◽  
R. Q. Tan ◽  
X. Li ◽  
J. H. Zhao ◽  
Z. L. Luo ◽  
...  
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Controlled Growth ◽  
Single Crystal Xrd ◽  
Xrd Study ◽  
Shape Controlled

Spectroscopic Investigations on New Organic NLO crystal – 2-amino-5-chloropyridinium-2,4-dinitrophenolate

2017 ◽  
Vol 232 (1) ◽  
Author(s):  
Pullithodi Mohamed Kutty ◽  
Joseph Chandrasekaran ◽  
Balraj Babu ◽  
Yoshitaka Matsushita
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Single Crystals ◽  
Room Temperature ◽  
Methanol Solution ◽  
Powder Xrd ◽  
Single Crystal Xrd ◽  
Slow Evaporation ◽  
Crystalline Phases ◽  
Evaporation Method

AbstractNew organic single crystals of 2-amino-5-chloropyridinium-2,4-dinitrophenolate were successfully grown by the slow evaporation method at room temperature from methanol solution. Crystal structure and crystalline phases were confirmed from the single crystal XRD and powder XRD, respectively.

The observation of defects on (100) CdTe surfaces by chemical etching

1992 ◽  
Vol 50 (2) ◽  
pp. 1424-1425
Author(s):  
M.E. Lee
Keyword(s):  
Single Crystal ◽  
Grain Boundaries ◽  
Single Crystals ◽  
Chemical Etching ◽  
Crystalline Perfection ◽  
Crystalline Defects ◽  
High Incidence ◽  
Crystallographic Defects ◽  
Cdznte Substrates ◽  
Device Technology

The crystalline perfection of bulk CdTe substrates plays an important role in their use in infrared device technology. The application of chemical etchants to determine crystal polarity or the density and distribution of crystallographic defects in (100) CdTe is not well understood. The lack of data on (100) CdTe surfaces is a result of the apparent difficulty in growing (100) CdTe single crystal substrates which is caused by a high incidence of twinning. Many etchants have been reported to predict polarity on one or both (111) CdTe planes but are considered to be unsuitable as defect etchants. An etchant reported recently has been considered to be a true defect etchant for CdTe, MCT and CdZnTe substrates. This etchant has been reported to reveal crystalline defects such as dislocations, grain boundaries and inclusions in (110) and (111) CdTe. In this study the effect of this new etchant on (100) CdTe surfaces is investigated.The single crystals used in this study were (100) CdTe as-cut slices (1mm thickness) from Bridgman-grown ingots.

Mounting an individual submicrometer sized single crystal

1996 ◽  
Vol 211 (6) ◽  
Author(s):  
R. B. Neder ◽  
M. Burghammer ◽  
Th. Grasl ◽  
H. Schulz
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
High Vacuum ◽  
Nanometer Resolution ◽  
Micro Manipulator ◽  
Scanning Electron

AbstractWe developed a new micro manipulator for mounting individual sub-micrometer sized single crystals within a scanning electron microscope. The translations are realized via a commercially available piezomicroscope, adapted for high vacuum usage and realize nanometer resolution. With this novel instrument it is routinely possible to mount individual single crystals with sizes down to 0.1

Crystal growth and scintillation properties of tube shape-controlled Ce-doped Y3Al5O12 single crystals grown by micro-pulling-down method

2020 ◽  
Vol 13 (12) ◽  
pp. 125503
Author(s):  
Atsushi Kotaki ◽  
Masao Yoshino ◽  
Yuui Yokota ◽  
Takashi Hanada ◽  
Akihiro Yamaji ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Single Crystals ◽  
Tube Shape ◽  
Shape Controlled
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