Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

The Analyst ◽  
2010 ◽  
Vol 135 (8) ◽  
pp. 1909 ◽  
Author(s):  
Shinsuke Kunimura ◽  
Jun Kawai
Keyword(s):  
Detection Limits ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Ray

Txrf-Sources-Samples and Detectors

1995 ◽  
Vol 39 ◽  
pp. 755-766
Author(s):  
P. Wobrauschek ◽  
P. Kregsamer ◽  
W. Ladisich ◽  
R. Riede ◽  
Christina Streli ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Detection Limits ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Light Elements ◽  
X Ray

Total reflection x-ray fluorescence analysis (TXRF) has reached a mature state but still improvements are possible in selecting the proper components for TXRF and optimizing them in the best suitable way. Two approaches are presented, the extension of the number of detectable elements after K-shell excitation and the improvement of the detection limits. The results show, that the elements from B to U can be detected by their characteristic K-lines and that detection limits for medium Z elements e.g. Ni in the fg range are achievable. Most of the best results have been measured using synchrotron radiation with spectral modifying devices like multilayer monochromators. Other x-ray sources like a windowless tube with exchangeable anodes of either material Al, Si or Mo were successfully tested for the efficient excitation of light elements.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

Selective Mercury Determination after Membrane Complexation and Total Reflection X-ray Fluorescence Analysis

2004 ◽  
Vol 76 (15) ◽  
pp. 4315-4319 ◽  
Author(s):  
Pavlos E. Koulouridakis ◽  
Nikolaos G. Kallithrakas-Kontos
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Mercury Determination ◽  
X Ray

Trace Element Determination in Diesel Particulates by Total-Reflection X-Ray Fluorescence Analysis

1999 ◽  
Vol 131 (3-4) ◽  
pp. 219-223 ◽  
Author(s):  
Juha K. Vilhunen ◽  
Alex von Bohlen ◽  
Martina Schmeling ◽  
Leena Rantanen ◽  
Seppo Mikkonen ◽  
...  
Keyword(s):  
Trace Element ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray

Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ (II)

1993 ◽  
Vol 32 (Part 1, No. 3A) ◽  
pp. 1191-1196 ◽  
Author(s):  
Kenji Yakushiji ◽  
Shinji Ohkawa ◽  
Atsushi Yoshinaga ◽  
Jimpei Harada
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Main Peak ◽  
X Ray

Total Reflection X-Ray Fluorescence Analysis of Natural and Drinking Waters

2018 ◽  
Vol 73 (11) ◽  
pp. 1093-1097 ◽  
Author(s):  
K. V. Oskolok ◽  
O. V. Monogarova ◽  
N. V. Alov
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Ray ◽  
Drinking Waters
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