The new future of scanning probe microscopy: Combining atomic force microscopy with other surface-sensitive techniques, optical microscopy and fluorescence techniques

Nanoscale ◽  
2009 ◽  
Vol 1 (1) ◽  
pp. 40 ◽  
Author(s):  
Susana Moreno Flores ◽  
José L. Toca-Herrera
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Fluorescence Techniques ◽  
Atomic Force

scholarly journals Microscopia de varredura por sonda (SPM) aplicada a aços inoxidáveis dúplex

2007 ◽  
Vol 60 (1) ◽  
pp. 183-187
Author(s):  
Fabricio Simão dos Santos ◽  
Simoni Maria Gheno ◽  
Sebastião Elias Kuri
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Nesse trabalho, a microscopia de varredura por sonda (Scanning Probe Microscopy - SPM), nos modos contato (Atomic Force Microscopy - AFM) e de força magnética (Magnetic Force Microscopy - MFM), foi utilizada para analisar a microestrutura de um aço inoxidável dúplex 2205 solubilizado e envelhecido. Foi feita uma análise por AFM da superfície do aço solubilizado após crescimento de filme passivo. Por AFM, obteve-se indicação de crescimento de filme sobre a microestrutura do aço solubilizado, enquanto por MFM a distribuição de fases pôde ser observada sem a necessidade de ataque da superfície.

scholarly journals Pushing the Envelope in Atomic Force Microscopy

2009 ◽  
Vol 17 (2) ◽  
pp. 26-29
Author(s):  
Monteith G. Heaton ◽  
Jason P. Cleveland
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Molecular Forces ◽  
New Instruments

Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades from the existing field of older AFM/SPMs on a variety of levels.

Bacteria and viruses in the objective of probe microscopy

2021 ◽  
Vol 3 ◽  
Author(s):  
I.V. Yaminsky ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in the atomic force microscopy mode, in particular, to the question, what data can be obtained using this method and how to interpret it.

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