Characterization and molecular engineering of surface-grafted polymer brushes across the length scales by atomic force microscopy

2010 ◽  
Vol 20 (24) ◽  
pp. 4981 ◽  
Author(s):  
Xiaofeng Sui ◽  
Szczepan Zapotoczny ◽  
Edmondo M. Benetti ◽  
Peter Schön ◽  
G. Julius Vancso
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brushes ◽  
Molecular Engineering ◽  
Length Scales ◽  
Grafted Polymer ◽  
Force Microscopy ◽  
Atomic Force

A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: application of a compressible fluid model

Nanoscale ◽  
2013 ◽  
Vol 5 (23) ◽  
pp. 11679 ◽  
Author(s):  
José Luis Cuellar ◽  
Irantzu Llarena ◽  
Jagoba J. Iturri ◽  
Edwin Donath ◽  
Sergio Enrique Moya
Keyword(s):  
Atomic Force Microscopy ◽  
Compressible Fluid ◽  
Polymer Brushes ◽  
Fluid Model ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach

High flexibility of DNA on short length scales probed by atomic force microscopy

2006 ◽  
Vol 1 (2) ◽  
pp. 137-141 ◽  
Author(s):  
Paul A. Wiggins ◽  
Thijn van der Heijden ◽  
Fernando Moreno-Herrero ◽  
Andrew Spakowitz ◽  
Rob Phillips ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Short Length ◽  
Length Scales ◽  
Force Microscopy ◽  
Atomic Force ◽  
High Flexibility

Surface Interaction Forces of Well-Defined, High-Density Polymer Brushes Studied by Atomic Force Microscopy. 1. Effect of Chain Length

2000 ◽  
Vol 33 (15) ◽  
pp. 5602-5607 ◽  
Author(s):  
Shinpei Yamamoto ◽  
Muhammad Ejaz ◽  
Yoshinobu Tsujii ◽  
Mutsuo Matsumoto ◽  
Takeshi Fukuda
Keyword(s):  
Atomic Force Microscopy ◽  
Chain Length ◽  
Polymer Brushes ◽  
Surface Interaction ◽  
High Density ◽  
Interaction Forces ◽  
Force Microscopy ◽  
Atomic Force

Multiscale Roughness of MEMS Surfaces

2004 ◽  
Author(s):  
Can K. Bora ◽  
Michael E. Plesha ◽  
Erin E. Flater ◽  
Mark D. Street ◽  
Robert W. Carpick ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Power Law ◽  
Multiscale Model ◽  
Length Scales ◽  
Microelectromechanical System ◽  
Force Microscopy ◽  
Atomic Force ◽  
Multiple Length Scales ◽  
Function Approximations

Investigation of contact and friction at multiple length scales is necessary for the design of surfaces in sliding microelectromechanical system (MEMS). A method is developed to investigate the geometry of asperities at different length scales. Analysis of density, height, and curvature of asperities on atomic force microscopy (AFM) images of actual silicon MEMS surfaces show these properties have a power law relationship with the sampling size used to define an asperity. This behavior and its similarity to results for fractal Weierstrass-Mandelbrot (W-M) function approximations indicate that a multiscale model is required to properly describe the surfaces.

Atomic Force Microscopy of Polymer Brushes: Colloidal versus Sharp Tips

Langmuir ◽  
2010 ◽  
Vol 26 (11) ◽  
pp. 8933-8940 ◽  
Author(s):  
A. Halperin ◽  
E. B. Zhulina
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brushes ◽  
Force Microscopy ◽  
Atomic Force

Entropic Effects on the Mechanical Behavior of Dry Polymer Brushes During Nanoindentation by Atomic Force Microscopy

2011 ◽  
Vol 44 (2) ◽  
pp. 368-374 ◽  
Author(s):  
Davide Tranchida ◽  
Elena Sperotto ◽  
Antoine Chateauminois ◽  
Holger Schönherr
Keyword(s):  
Atomic Force Microscopy ◽  
Mechanical Behavior ◽  
Polymer Brushes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Entropic Effects
Sign in / Sign up

Export Citation Format

Share Document