Sulfur-induced offsets in MC-ICP-MS silicon-isotope measurements

2009 ◽  
Vol 24 (8) ◽  
pp. 1111 ◽  
Author(s):  
Sander H. J. M. van den Boorn ◽  
Pieter Z. Vroon ◽  
Manfred J. van Bergen
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pp. 3305-3311 ◽  
Author(s):  
KeJun Hou ◽  
YanHe Li ◽  
YingKai Xiao ◽  
Feng Liu ◽  
YouRong Tian

2016 ◽  
Vol 29 (4) ◽  
pp. 221-227
Author(s):  
Sanghee Park ◽  
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Jong-Sik Ryu ◽  
Hyung Seon Shin ◽  
Youngwoo Kil ◽  
...  

2019 ◽  
Vol 43 (2) ◽  
pp. 291-300 ◽  
Author(s):  
Zhen Zeng ◽  
Xiaohua Li ◽  
Yi Liu ◽  
Fang Huang ◽  
Hui‐Min Yu

2021 ◽  
Vol 42 (1) ◽  
pp. 1-10
Author(s):  
Ah Yeong Choi ◽  
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Jong-Sik Ryu ◽  
Kiseong Hyeong ◽  
Mun Gi Kim ◽  
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2006 ◽  
Vol 21 (8) ◽  
pp. 734 ◽  
Author(s):  
Sander H. J. M. van den Boorn ◽  
Pieter Z. Vroon ◽  
Coos C. van Belle ◽  
Bas van der Wagt ◽  
Johannes Schwieters ◽  
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2015 ◽  
Vol 30 (11) ◽  
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Author(s):  
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Fei Wu ◽  
Zhaofeng Zhang ◽  
Zhenhui Hou ◽  
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This article presents a high precision method for Ba isotope measurements using multiple-collector inductively coupled plasma-mass spectrometry (MC-ICP-MS).


2020 ◽  
Author(s):  
Yang Yu ◽  
Christopher Siebert ◽  
Jan Fietzke ◽  
Tyler Goepfert ◽  
Ed Hathorne ◽  
...  

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