Dissociative recombination of fully deuterated protonated acetonitrile, CD3CND+: product branching fractions, absolute cross section and thermal rate coefficient

2008 ◽  
Vol 10 (27) ◽  
pp. 4014 ◽  
Author(s):  
Erik Vigren ◽  
Magdalena Kamińska ◽  
Mathias Hamberg ◽  
Vitali Zhaunerchyk ◽  
Richard D. Thomas ◽  
...  
2007 ◽  
Vol 9 (22) ◽  
pp. 2856-2861 ◽  
Author(s):  
Erik Vigren ◽  
Magdalena Kamińska ◽  
Mathias Hamberg ◽  
Vitali Zhaunerchyk ◽  
Richard D. Thomas ◽  
...  

2008 ◽  
Vol 273 (3) ◽  
pp. 111-116 ◽  
Author(s):  
M. Danielsson ◽  
M. Hamberg ◽  
V. Zhaunerchyk ◽  
A. Ehlerding ◽  
M. Kamińska ◽  
...  

1996 ◽  
Vol 03 (01) ◽  
pp. 679-682 ◽  
Author(s):  
H. TANAKA ◽  
T. MIZUNO ◽  
J. HIROKAWA ◽  
S. NONOSE ◽  
T. KONDOW

Collision-induced reactions of [Formula: see text](n=2–9) with Ne and Kr were investigated by means of a Tandem mass spectrometer equipped with octapole ion guide. The dominant processes were evaporation of a Na atom from [Formula: see text] with even sizes or Na 2 molecules from those with odd sizes. The absolute cross section for the reaction was measured as functions of the parent-cluster size and the collision energy. The branching fractions of the daughter-ion production were also determined. These results are interpreted in a scheme of a pair interaction in jellium background.


2005 ◽  
Vol 103 (20) ◽  
pp. 2735-2745 ◽  
Author(s):  
V. Zhaunerchyk ◽  
F. Hellberg ◽  
A. Ehlerding ◽  
W. D. Geppert ◽  
M. Larsson ◽  
...  

2008 ◽  
Vol 681 (2) ◽  
pp. 1717-1724 ◽  
Author(s):  
M. Kamińska ◽  
E. Vigren ◽  
V. Zhaunerchyk ◽  
W. D. Geppert ◽  
H. Roberts ◽  
...  

Author(s):  
P.A. Crozier

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.


1970 ◽  
Vol 18 (4) ◽  
pp. 523-531 ◽  
Author(s):  
I.D. Clark ◽  
R.P. Wayne

2009 ◽  
Vol 32 (1) ◽  
pp. 157-164 ◽  
Author(s):  
Karlheinz Hoyermann ◽  
Frank Nacke ◽  
Jörg Nothdurft ◽  
Matthias Olzmann ◽  
Jens Wehmeyer ◽  
...  

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