Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces

2006 ◽  
Vol 8 (33) ◽  
pp. 3909 ◽  
Author(s):  
Phillip S. Dobson ◽  
John M. R. Weaver ◽  
David P. Burt ◽  
Mark N. Holder ◽  
Neil R. Wilson ◽  
...  
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