Direct analysis of silicon carbide by fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a slurry sampling technique

The Analyst ◽  
2000 ◽  
Vol 125 (11) ◽  
pp. 2089-2093 ◽  
Author(s):  
Tianyou Peng ◽  
Xiaohai Sheng ◽  
Bin Hu ◽  
Zucheng Jiang
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