Comparison of fundamental characteristics between radio-frequency and direct current powering of a single glow discharge atomic emission spectroscopy source

1998 ◽  
Vol 13 (10) ◽  
pp. 1159-1165 ◽  
Author(s):  
Xiaohan Pan ◽  
Bin Hu ◽  
Yuancai Ye ◽  
R. Kenneth Marcus
Keyword(s):  
Glow Discharge ◽  
Radio Frequency ◽  
Direct Current ◽  
Emission Spectroscopy ◽  
Atomic Emission ◽  
Atomic Emission Spectroscopy

Rapid Depth-Resolved Analysis of Nitride Layers (>50 Micrometers) on Prosthetic Devices by Radio Frequency Glow Discharge Atomic Emission Spectroscopy

1998 ◽  
Vol 550 ◽  
Author(s):  
R. Kenneth ◽  
Matthew L. Hartenstein ◽  
Richard Compton ◽  
Ravi Shetty
Keyword(s):  
Glow Discharge ◽  
Radio Frequency ◽  
Analytical Methods ◽  
Emission Spectroscopy ◽  
Atomic Emission ◽  
Atomic Emission Spectroscopy ◽  
Chemical Information ◽  
Prosthetic Devices ◽  
Radio Frequency Glow Discharge ◽  
Nitride Layers

AbstractThe ability to provide depth-resolved chemical information is an important attribute for analytical methods employed in the biomaterials laboratory, both research and production. Radio frequency glow discharge atomic emission spectroscopy (rf-GD-AES) is shown to provide profiles of nitrogen content in prosthetic alloys to depths of greater than 50 micrometers, with analysis times of less than 30 minutes.

Depth Profiling of Solution-Deposited Lead Zirconate Titanate Thin Films by Radio Frequency Glow Discharge Atomic Emission Spectroscopy (RF-GDAES)

1999 ◽  
Vol 596 ◽  
Author(s):  
K. S Brinkman ◽  
R. W. Schwartz ◽  
R. K Marcus ◽  
A. Anfone
Keyword(s):  
Thin Films ◽  
Glow Discharge ◽  
Radio Frequency ◽  
Lead Zirconate Titanate ◽  
Emission Spectroscopy ◽  
Depth Profiling ◽  
Atomic Emission ◽  
Lead Zirconate ◽  
Atomic Emission Spectroscopy ◽  
Radio Frequency Glow Discharge

AbstractCompositional depth profiles have been obtained on chemical solution deposited lead zirconate titanate (PZT) thin films using radio-frequency glow discharge atomic emission spectroscopy. The technique is very rapid, requiring less than one minute for complete multi-element depth profiling of films and multilayer substrates. In the present study, the method was employed to obtain compositional profiles of the various metallic (Pb, Zr, Ti, Si) and organic-related (C, H, O) species that are present in the films and underlying device. Preliminary results using this relatively new technique are reported for PZT films deposited by an aqueous acetate process and heat treated at temperatures ranging from 300 and 700°C. The initial results from these investigations suggest that Pb volatilization occurs at temperatures as low as those typically encountered during the pyrolysis step. Significant interdiffusion of the Pb into the underlying Pt electrode at this temperature is also suggested. Effects of modifying ligand on film thickness and organic decomposition behavior were also observed.

Sign in / Sign up

Export Citation Format

Share Document