scholarly journals Characterization of photocatalytic TiO2 powder under varied environments using near ambient pressure X-ray photoelectron spectroscopy

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Padmaja Krishnan ◽  
Minghui Liu ◽  
Pierre A. Itty ◽  
Zhi Liu ◽  
Vanessa Rheinheimer ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
Tio2 Powder ◽  
X Ray ◽  
Photocatalytic Tio2

Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials

2019 ◽  
Vol 26 (1) ◽  
pp. 016801 ◽  
Author(s):  
Dhananjay I. Patel ◽  
Tuhin Roychowdhury ◽  
Varun Jain ◽  
Dhruv Shah ◽  
Tahereh G. Avval ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
X Ray

scholarly journals Ambient-Pressure X-ray Photoelectron Spectroscopy Characterization of Radiation-Induced Chemistries of Organotin Clusters

2018 ◽  
Vol 11 (2) ◽  
pp. 2526-2534 ◽  
Author(s):  
J. Trey Diulus ◽  
Ryan T. Frederick ◽  
Mengjun Li ◽  
Danielle C. Hutchison ◽  
Morgan R. Olsen ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
X Ray ◽  
Radiation Induced

The Growth and Characterization of Germanium-Carbon Alloy Thin Films

1992 ◽  
Vol 270 ◽  
Author(s):  
Haojie Yuan ◽  
R. Stanley Williams
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Vacuum Chamber ◽  
Optical Band Gap ◽  
High Vacuum ◽  
Optical Absorption Spectroscopy ◽  
Alloy Thin Film ◽  
New Materials ◽  
X Ray

ABSTRACTThin films of pure germanium-carbon alloys (GexC1−x with x ≈ 0.0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) have been grown on Si(100) and A12O3 (0001) substrates by pulsed laser ablation in a high vacuum chamber. The films were analyzed by x-ray θ-2θ diffraction (XRD), x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), conductivity measurements and optical absorption spectroscopy. The analyses of these new materials showed that films of all compositions were amorphous, free of contamination and uniform in composition. By changing the film composition, the optical band gap of these semiconducting films was varied from 0.00eV to 0.85eV for x = 0.0 to 1.0 respectively. According to the AES results, the carbon atoms in the Ge-C alloy thin film samples has a bonding configuration that is a mixture of sp2 and sp3 hybridizations.

scholarly journals In situ monitoring of the influence of water on DNA radiation damage by near-ambient pressure X-ray photoelectron spectroscopy

2021 ◽  
Vol 4 (1) ◽  
Author(s):  
Marc Benjamin Hahn ◽  
Paul M. Dietrich ◽  
Jörg Radnik
Keyword(s):  
Dna Damage ◽  
Radiation Damage ◽  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
In Situ Monitoring ◽  
Strong Increase ◽  
Oh Radicals ◽  
Strand Breaks ◽  
X Ray

AbstractIonizing radiation damage to DNA plays a fundamental role in cancer therapy. X-ray photoelectron-spectroscopy (XPS) allows simultaneous irradiation and damage monitoring. Although water radiolysis is essential for radiation damage, all previous XPS studies were performed in vacuum. Here we present near-ambient-pressure XPS experiments to directly measure DNA damage under water atmosphere. They permit in-situ monitoring of the effects of radicals on fully hydrated double-stranded DNA. The results allow us to distinguish direct damage, by photons and secondary low-energy electrons (LEE), from damage by hydroxyl radicals or hydration induced modifications of damage pathways. The exposure of dry DNA to x-rays leads to strand-breaks at the sugar-phosphate backbone, while deoxyribose and nucleobases are less affected. In contrast, a strong increase of DNA damage is observed in water, where OH-radicals are produced. In consequence, base damage and base release become predominant, even though the number of strand-breaks increases further.

scholarly journals New ambient pressure X-ray photoelectron spectroscopy endstation at Taiwan light source

2019 ◽  
Author(s):  
Chia-Hsin Wang ◽  
Sun-Tang Chang ◽  
Sheng-Yuan Chen ◽  
Yaw-Wen Yang
Keyword(s):  
Light Source ◽  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
X Ray
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