scholarly journals Erratum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Maheswar Nayak ◽  
P. C. Pradhan ◽  
G. S. Lodha ◽  
A. Sokolov ◽  
F. Schäfers
Keyword(s):  
High Resolution ◽  
Interface Structure ◽  
Low Contrast ◽  
Spatially Resolved ◽  
Atomic Profile

scholarly journals Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Maheswar Nayak ◽  
P. C. Pradhan ◽  
G. S. Lodha ◽  
A. Sokolov ◽  
F. Schäfers
Keyword(s):  
High Resolution ◽  
Electron Density ◽  
Resonant Scattering ◽  
Interface Structure ◽  
Distribution Profile ◽  
Low Contrast ◽  
X Ray ◽  
Spatially Resolved ◽  
Quantitative Manner ◽  
Non Destructive

Abstract We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-destructive and quantitative manner. We demonstrate that the method is sensitive enough to resolve compositional differences of few atomic percent in nano-scaled layered structures of elements with poor electron density differences (0.05%). The present study near the edge of potential impurities in soft x-ray range for low-Z system will stimulate the activity in that field.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

“High Resolution High Voltage Electron Microscopy”

1968 ◽  
Vol 26 ◽  
pp. 326-327
Author(s):  
Benjamin M. Siegel
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Voltage ◽  
Full Potential ◽  
Contrast Imaging ◽  
High Voltage Electron Microscopy ◽  
Low Contrast ◽  
Voltage Electron ◽  
Critical Areas ◽  
High Voltage Electron

The potential advantages of high voltage electron microscopy for extending the limits of resolution and contrast in imaging low contrast objects, such as biomolecular specimens, is very great. The results of computations will be presented showing that at accelerating voltages of 500-1000 kV it should be possible to achieve spacial resolutions of 1 to 1.5 Å and using phase contrast imaging achieve adequate image contrast to observe single atoms of low atomic number.The practical problems associated with the design and utilization of the high voltage instrument are, optimistically, within the range of competence of the state of the art. However, there are some extremely important and critical areas to be systematically investigated before we have achieved this competence. The basic electron optics of the column required is well understood, but before the full potential of an instrument capable of resolutions of better than 1.5 Å are realized some very careful development work will be required. Of great importance for the actual achievement of high resolution with a high voltage electron microscope is the fundamental limitation set by the characteristics of the high voltage electron beam that can be obtained from the accelerator column.

High-resolution scanning electron microscopy in biology

1990 ◽  
Vol 48 (3) ◽  
pp. 14-15
Author(s):  
Keiichi Tanaka
Keyword(s):  
High Resolution ◽  
Immunoglobulin M ◽  
Metal Coating ◽  
Biological Macromolecules ◽  
Ultrahigh Resolution ◽  
Preparation Methods ◽  
Low Contrast ◽  
Almost All ◽  
Charging Effect ◽  
Scanning Electron

With the development of scanning electron microscope (SEM) with ultrahigh resolution, SEM became to play an important role in not only cytology but also molecular biology. However, the preparation methods observing tiny specimens with such high resolution SEM are not yet established.Although SEM specimens are usually coated with metals for getting electrical conductivity, it is desirable to avoid the metal coating for high resolution SEM, because the coating seriously affects resolution at this level, unless special coating techniques are used. For avoiding charging effect without metal coating, we previously reported a method in which polished carbon plates were used as substrate. In the case almost all incident electrons penetrate through the specimens and do not accumulate in them, when the specimens are smaller than 10nm. By this technique some biological macromolecules including ribosomes, ferritin, immunoglobulin G were clearly observed.Unfortunately some other molecules such as apoferritin, thyroglobulin and immunoglobulin M were difficult to be observed only by the method, because they had very low contrast and were easily damaged by electron beam.

Very low contrast X-ray masks for high resolution printing

1998 ◽  
Vol 41-42 ◽  
pp. 275-278 ◽  
Author(s):  
Y. Chen ◽  
G. Simon ◽  
A.M. Haghiri-Gosnet ◽  
L. Manin ◽  
H. Launois
Keyword(s):  
High Resolution ◽  
Low Contrast ◽  
X Ray

High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

2019 ◽  
Vol 212 ◽  
pp. 1-8 ◽  
Author(s):  
Krzysztof Gajewski ◽  
Piotr Kunicki ◽  
Andrzej Sierakowski ◽  
Witold Szymański ◽  
Witold Kaczorowski ◽  
...  
Keyword(s):  
High Resolution ◽  
Surface Potential ◽  
High Strength ◽  
Spatially Resolved ◽  
Scanning Tunnelling

scholarly journals Detailed X-ray Observations of the Cygnus Loop

1983 ◽  
Vol 101 ◽  
pp. 253-260
Author(s):  
W. H.-M. Ku ◽  
K. Long ◽  
R. Pisarski ◽  
M. Vartanian
Keyword(s):  
High Resolution ◽  
Proportional Counter ◽  
Supernova Remnant ◽  
Sounding Rocket ◽  
Loop Structure ◽  
High Quality ◽  
Radio Structure ◽  
X Ray ◽  
Cygnus Loop ◽  
Spatially Resolved

High quality X-ray spectral and imaging observations of the Cygnus Loop have been obtained with three different instruments. The High Resolution Imager (HRI) on the Einstein Observatory was used to obtain arcsecond resolution images of select bright regions in the Cygnus Loop which permit detailed comparisons between the X-ray, optical, and radio structure of the Loop. The Imaging Proportional Counter (IPC) on the Einstein Observatory was used to obtain an arcminute resolution map of essentially the full Loop structure. Finally, an Imaging Gas Scintillation Proportional Counter (IGSPC), carried aloft by a sounding rocket last fall, obtained modest resolution, spatially resolved spectrophotometry of the Cygnus Loop. An X-ray map of the Loop in the energy of the 0 VIII line was obtained. These data combine to yield a very powerful probe of the abundance, temperature, and density distribution of material in the supernova remnant, and in the interstellar medium.

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