scholarly journals Determination of ferroelectric contributions to electromechanical response by frequency dependent piezoresponse force microscopy

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Daehee Seol ◽  
Seongjae Park ◽  
Olexandr V. Varenyk ◽  
Shinbuhm Lee ◽  
Ho Nyung Lee ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Frequency Dependent ◽  
Force Microscopy

scholarly journals Non-destructive determination of collagen fibril width in extruded collagen fibres by piezoresponse force microscopy

2017 ◽  
Vol 3 (5) ◽  
pp. 055004 ◽  
Author(s):  
Arwa Bazaid ◽  
Sabine M Neumayer ◽  
Anna Sorushanova ◽  
Jill Guyonnet ◽  
Dimitrios Zeugolis ◽  
...  
Keyword(s):  
Collagen Fibril ◽  
Piezoresponse Force Microscopy ◽  
Collagen Fibres ◽  
Force Microscopy ◽  
Non Destructive

Drive frequency dependent phase imaging in piezoresponse force microscopy

2010 ◽  
Vol 108 (4) ◽  
pp. 042003 ◽  
Author(s):  
Huifeng Bo ◽  
Yi Kan ◽  
Xiaomei Lu ◽  
Yunfei Liu ◽  
Song Peng ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Phase Imaging ◽  
Frequency Dependent ◽  
Force Microscopy ◽  
Drive Frequency

scholarly journals Quantitative determination of tip parameters in piezoresponse force microscopy

2007 ◽  
Vol 90 (21) ◽  
pp. 212905 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Stephen Jesse ◽  
Brian J. Rodriguez ◽  
Eugene A. Eliseev ◽  
Venkatraman Gopalan ◽  
...  
Keyword(s):  
Quantitative Determination ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy

Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy

2010 ◽  
Vol 21 (40) ◽  
pp. 405703 ◽  
Author(s):  
S Jesse ◽  
S Guo ◽  
A Kumar ◽  
B J Rodriguez ◽  
R Proksch ◽  
...  
Keyword(s):  
Cross Talk ◽  
Piezoresponse Force Microscopy ◽  
Frequency Dependent ◽  
Force Microscopy

Frequency-Dependent Electromechanical Response in Ferroelectric Materials Measured via Piezoresponse Force Microscopy

2003 ◽  
Vol 784 ◽  
Author(s):  
I. K. Bdikin ◽  
V. V. Shvartsman ◽  
S-H. Kim ◽  
J. Manuel Herrero ◽  
A. L. Kholkin
Keyword(s):  
Simple Model ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Materials ◽  
Piezoelectric Response ◽  
Driving Frequency ◽  
Polarization Direction ◽  
Frequency Dependent ◽  
Force Microscopy ◽  
Out Of Plane ◽  
Frequency Phase

ABSTRACTLocal piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10–100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

Anisotropy of Nanoindentation – a tool for the determination of nanocrystal orientation ?

2003 ◽  
Vol 779 ◽  
Author(s):  
David Christopher ◽  
Steven Kenny ◽  
Roger Smith ◽  
Asta Richter ◽  
Bodo Wolf ◽  
...  
Keyword(s):  
Crystal Surface ◽  
Scanning Force Microscopy ◽  
Depth Range ◽  
Dislocation Loops ◽  
Force Microscopy ◽  
Pile Up ◽  
Out Of Plane ◽  
Scanning Force ◽  
Dynamics Simulations

AbstractThe pile up patterns arising in nanoindentation are shown to be indicative of the sample crystal symmetry. To explain and interpret these patterns, complementary molecular dynamics simulations and experiments have been performed to determine the atomistic mechanisms of the nanoindentation process in single crystal Fe{110}. The simulations show that dislocation loops start from the tip and end on the crystal surface propagating outwards along the four in-plane <111> directions. These loops carry material away from the indenter and form bumps on the surface along these directions separated from the piled-up material around the indenter hole. Atoms also move in the two out-of-plane <111> directions causing propagation of subsurface defects and pile-up around the hole. This finding is confirmed by scanning force microscopy mapping of the imprint, the piling-up pattern proving a suitable indicator of the surface crystallography. Experimental force-depth curves over the depth range of a few nanometers do not appear smooth and show distinct pop-ins. On the sub-nanometer scale these pop-ins are also visible in the simulation curves and occur as a result of the initiation of the dislocation loops from the tip.

In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”

2021 ◽  
Vol 543 ◽  
pp. 148808
Author(s):  
D.O. Alikin ◽  
L.V. Gimadeeva ◽  
A.V. Ankudinov ◽  
Q. Hu ◽  
V.Ya. Shur ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Polarization Contribution
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