scholarly journals Nodal quasiparticle meltdown in ultrahigh-resolution pump–probe angle-resolved photoemission

2011 ◽  
Vol 7 (10) ◽  
pp. 805-809 ◽  
Author(s):  
J. Graf ◽  
C. Jozwiak ◽  
C. L. Smallwood ◽  
H. Eisaki ◽  
R. A. Kaindl ◽  
...  
Keyword(s):  
Ultrahigh Resolution ◽  
Pump Probe ◽  
Probe Angle

Development of 200kV ultrahigh-resolution analytical electron microscope

1989 ◽  
Vol 47 ◽  
pp. 108-109
Author(s):  
T. Kaneyama ◽  
M. Naruse ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Optical Constants ◽  
Materials Science ◽  
Objective Lens ◽  
The Finite Element Method ◽  
Ultrahigh Resolution ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Characteristic Features ◽  
Better Than

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.

High-resolution scanning electron microscopy in biology

1990 ◽  
Vol 48 (3) ◽  
pp. 14-15
Author(s):  
Keiichi Tanaka
Keyword(s):  
High Resolution ◽  
Immunoglobulin M ◽  
Metal Coating ◽  
Biological Macromolecules ◽  
Ultrahigh Resolution ◽  
Preparation Methods ◽  
Low Contrast ◽  
Almost All ◽  
Charging Effect ◽  
Scanning Electron

With the development of scanning electron microscope (SEM) with ultrahigh resolution, SEM became to play an important role in not only cytology but also molecular biology. However, the preparation methods observing tiny specimens with such high resolution SEM are not yet established.Although SEM specimens are usually coated with metals for getting electrical conductivity, it is desirable to avoid the metal coating for high resolution SEM, because the coating seriously affects resolution at this level, unless special coating techniques are used. For avoiding charging effect without metal coating, we previously reported a method in which polished carbon plates were used as substrate. In the case almost all incident electrons penetrate through the specimens and do not accumulate in them, when the specimens are smaller than 10nm. By this technique some biological macromolecules including ribosomes, ferritin, immunoglobulin G were clearly observed.Unfortunately some other molecules such as apoferritin, thyroglobulin and immunoglobulin M were difficult to be observed only by the method, because they had very low contrast and were easily damaged by electron beam.

Development of high-performance objective lens polepiece for ultrahigh resolution Analytical Electron Microscope

1993 ◽  
Vol 51 ◽  
pp. 254-255
Author(s):  
K. Fukushima ◽  
T. Kaneyama ◽  
F. Hosokawa ◽  
H. Tsuno ◽  
T. Honda ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Performance ◽  
Open Space ◽  
Materials Science ◽  
Objective Lens ◽  
Ultrahigh Resolution ◽  
Science Field ◽  
Specimen Holder ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Recently, in the materials science field, the ultrahigh resolution analytical electron microscope (UHRAEM) has become a very important instrument to study extremely fine areas of the specimen. The requirements related to the performance of the UHRAEM are becoming gradually severer. Some basic characteristic features required of an objective lens are as follows, and the practical performance of the UHRAEM should be judged by totally evaluating them.1) Ultrahigh resolution to resolve ultrafine structure by atomic-level observation.2) Nanometer probe analysis to analyse the constituent elements in nm-areas of the specimen.3) Better performance of x-ray detection for EDS analysis, that is, higher take-off angle and larger detection solid angle.4) Higher specimen tilting angle to adjust the specimen orientation.To attain these requirements simultaneously, the objective lens polepiece must have smaller spherical and chromatic aberration coefficients and must keep enough open space around the specimen holder in it.

Pump-Probe Measurements Using Silicon Nanocrystal Waveguides

2003 ◽  
Vol 770 ◽  
Author(s):  
Nathanael Smith ◽  
Max J. Lederer ◽  
Marek Samoc ◽  
Barry Luther-Davies ◽  
Robert G. Elliman
Keyword(s):  
Probe Beam ◽  
Time Resolution ◽  
Pump Beam ◽  
Silicon Nanocrystals ◽  
Continuous Wave ◽  
Optical Gain ◽  
Optical Pump ◽  
Time Resolved ◽  
Pump Probe ◽  
Probe Measurements

AbstractOptical pump-probe measurements were performed on planar slab waveguides containing silicon nanocrystals in an attempt to measure optical gain from photo-excited silicon nanocrystals. Two experiments were performed, one with a continuous-wave probe beam and a pulsed pump beam, giving a time resolution of approximately 25 ns, and the other with a pulsed pump and probe beam, giving a time resolution of approximately 10 ps. In both cases the intensity of the probe beam was found to be attenuated by the pump beam, with the attenuation increasing monotonically with increasing pump power. Time-resolved measurements using the first experimental arrangement showed that the probe signal recovered its initial intensity on a time scale of 45-70 μs, a value comparable to the exciton lifetime in Si nanocrystals. These data are shown to be consistent with an induced absorption process such as confined carrier absorption. No evidence for optical gain was observed.

Density matrix and rate equation analyses for picosecond pump/probe combustion diagnostics

AIAA Journal ◽  
1999 ◽  
Vol 37 ◽  
pp. 723-731
Author(s):  
Thomas Settersten ◽  
Mark Linne ◽  
James Gord ◽  
Gregory Feichtner
Keyword(s):  
Density Matrix ◽  
Rate Equation ◽  
Pump Probe ◽  
Combustion Diagnostics

Two-Dimensional Infrared Spectroscopy From the Gas to Liquid Phase: Density Dependent J-Scrambling, Vibrational Relaxation, and the Onset of Liquid Character

2019 ◽  
Author(s):  
Greg Ng Pack ◽  
Matthew Rotondaro ◽  
Parth Shah ◽  
Aritra Mandal ◽  
Shyamsunder Erramilli ◽  
...  
Keyword(s):  
Vibrational Energy ◽  
Rotational Relaxation ◽  
Vibrational Energy Relaxation ◽  
Pump Probe ◽  
Solution Dynamics ◽  
Supercritical Phase ◽  
Supercritical Solution ◽  
Asymmetric Stretch ◽  
Two Dimensional Infrared Spectroscopy ◽  
Vibrational Equilibrium

Ultrafast 2DIR spectra and pump-probe responses of the N2O n 3 asymmetric stretch in SF6 as a function of density from the gas to supercritical phase and liquid are reported. 2DIR spectra unequivocally reveal free rotor character at all densities studied in the gas and supercritical region. Analysis of the 2DIR spectra determines that J-scrambling or rotational relaxation in N2O is highly efficient, occurring in ~1.5 to ~2 collisions with SF6 at all non-liquid densities. In contrast, N2O n 3 vibrational energy relaxation requires ~15 collisions, and complete vibrational equilibrium occurs on the ~ns scale at all densities. An independent binary collision model is sufficient to describe these supercritical state point dynamics. The N2O n 3 in liquid SF6 2DIR spectrum shows no evidence of free rotor character or spectral diffusion. Using these 2DIR results, hindered rotor or liquid-like character is found in gas and all supercritical solutions for SF6 densities ³ r * = 0.3, and increases with SF6 density. 2DIR spectral analysis offers direct time domain evidence of critical slowing for SF6 solutions closest to the critical point density. Applications of 2DIR to other high density and supercritical solution dynamics and descriptions are discussed. <br>

Ultrahigh Resolution Ion Beam Processes

1976 ◽  
Author(s):  
R. L. Seliger ◽  
J. W. Ward ◽  
D. Hunken
Keyword(s):  
Ion Beam ◽  
Ultrahigh Resolution
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