scholarly journals Near-field cavity optomechanics with nanomechanical oscillators

2009 ◽  
Vol 5 (12) ◽  
pp. 909-914 ◽  
Author(s):  
G. Anetsberger ◽  
O. Arcizet ◽  
Q. P. Unterreithmeier ◽  
R. Rivière ◽  
A. Schliesser ◽  
...  
Keyword(s):  
Near Field ◽  
Cavity Optomechanics ◽  
Nanomechanical Oscillators

scholarly journals Near-field Cavity Optomechanics with Nanomechanical Oscillators

2010 ◽  
Author(s):  
G. Anetsberger ◽  
O. Arcizet ◽  
E. Gavartin ◽  
Q. P. Unterreithmeier ◽  
E. M. Weig ◽  
...  
Keyword(s):  
Near Field ◽  
Cavity Optomechanics ◽  
Nanomechanical Oscillators

scholarly journals Near-field cavity optomechanical coupling in a compound semiconductor nanowire

2020 ◽  
Author(s):  
Motoki Asano ◽  
Guoqiang Zhang ◽  
Takehiko Tawara ◽  
Hiroshi Yamaguchi ◽  
Hajime Okamoto
Keyword(s):  
Near Field ◽  
Optical Cavity ◽  
Compound Semiconductor ◽  
Size Difference ◽  
Mechanical Motion ◽  
Cavity Optomechanics ◽  
Free Standing ◽  
Semiconductor Nanowire ◽  
Standing Structure ◽  
Optomechanical Coupling

Abstract A III-V compound semiconductor nanowire is an attractive material for a novel hybrid quantum interface that interconnects photons, electrons, and phonons through a wavelength-tunable quantum structure embedded in its free-standing structure. In such a nanomechanical element, however, a challenge is how to detect and manipulate a small number of phonons via its tiny mechanical motion. A solution would be to couple an optical cavity to a nanowire by introducing the "cavity optomechanics" framework, but the typical size difference between them becomes a barrier to achieving this. Here, we demonstrate near-field coupling of a silica microsphere cavity and an epitaxially grown InP/InAs free-standing nanowire. The evanescent optomechanical coupling enables not only fine probing of the mechanical motion by balanced homodyne interferometry but also tuning of the resonance frequency, linewidth, Duffing nonlinearity, and vibration axis in the nanowire. Combining this cavity optomechanics with epitaxial nanowire engineering opens the way to novel quantum metrology and information processing.

scholarly journals Near-field cavity optomechanical coupling in a compound semiconductor nanowire

2020 ◽  
Vol 3 (1) ◽  
Author(s):  
Motoki Asano ◽  
Guoqiang Zhang ◽  
Takehiko Tawara ◽  
Hiroshi Yamaguchi ◽  
Hajime Okamoto
Keyword(s):  
Near Field ◽  
Optical Cavity ◽  
Compound Semiconductor ◽  
Size Difference ◽  
Mechanical Motion ◽  
Cavity Optomechanics ◽  
Free Standing ◽  
Semiconductor Nanowire ◽  
Standing Structure ◽  
Optomechanical Coupling

AbstractA III-V compound semiconductor nanowire is an attractive material for a novel hybrid quantum interface that interconnects photons, electrons, and phonons through a wavelength-tunable quantum structure embedded in its free-standing structure. In such a nanomechanical element, however, a challenge is how to detect and manipulate a small number of phonons via its tiny mechanical motion. A solution would be to couple an optical cavity to a nanowire by introducing the ‘cavity optomechanics' framework, but the typical size difference between them becomes a barrier to achieving this. Here, we demonstrate near-field coupling of a silica microsphere cavity and an epitaxially grown InP/InAs free-standing nanowire. The evanescent optomechanical coupling enables not only fine probing of the nanowire’s mechanical motion by balanced homodyne interferometry but also tuning of the resonance frequency, linewidth, Duffing nonlinearity, and vibration axis in it. Combining this cavity optomechanics with epitaxial nanowire engineering opens the way to novel quantum metrology and information processing.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements
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