Resolved-sideband Raman cooling of an optical phonon in semiconductor materials

Jun Zhang; Qing Zhang; Xingzhi Wang; Leong Chuan Kwek; Qihua Xiong

doi:10.1038/nphoton.2016.122

Resolved-sideband Raman cooling of an optical phonon in semiconductor materials

Nature Photonics ◽

10.1038/nphoton.2016.122 ◽

2016 ◽

Vol 10 (9) ◽

pp. 600-605 ◽

Cited By ~ 19

Author(s):

Jun Zhang ◽

Qing Zhang ◽

Xingzhi Wang ◽

Leong Chuan Kwek ◽

Qihua Xiong

Keyword(s):

Optical Phonon ◽

Semiconductor Materials ◽

Raman Cooling

Download Full-text

Publisher Correction: Resolved-sideband Raman cooling of an optical phonon in semiconductor materials

Nature Photonics ◽

10.1038/s41566-019-0440-4 ◽

2019 ◽

Vol 13 (6) ◽

pp. 436-436

Author(s):

Jun Zhang ◽

Qing Zhang ◽

Xingzhi Wang ◽

Leong Chuan Kwek ◽

Qihua Xiong

Keyword(s):

Optical Phonon ◽

Semiconductor Materials ◽

Raman Cooling

Download Full-text

Cathodoluminescence of Catalyst Crystallites

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100055667 ◽

1982 ◽

Vol 40 ◽

pp. 664-665

Author(s):

E.D. Boyes ◽

P.L. Gai ◽

D.B. Darby ◽

C. Warwick

Keyword(s):

Defect Density ◽

Chemical Properties ◽

Operating Conditions ◽

Semiconductor Materials ◽

Environmental Cell ◽

High Resolution Structure ◽

Commercially Important ◽

Crystallographic Defects ◽

Resolution Structure

The extended crystallographic defects introduced into some oxide catalysts under operating conditions may be a consequence and accommodation of the changes produced by the catalytic activity, rather than always being the origin of the reactivity. Operation without such defects has been established for the commercially important tellurium molybdate system. in addition it is clear that the point defect density and the electronic structure can both have a significant influence on the chemical properties and hence on the effectiveness (activity and selectivity) of the material as a catalyst. SEM/probe techniques more commonly applied to semiconductor materials, have been investigated to supplement the information obtained from in-situ environmental cell HVEM, ultra-high resolution structure imaging and more conventional AEM and EPMA chemical microanalysis.

Download Full-text