Surface imaging beyond the diffraction limit with optically trapped spheres

2015 ◽  
Vol 10 (12) ◽  
pp. 1064-1069 ◽  
Author(s):  
Lars Friedrich ◽  
Alexander Rohrbach
Keyword(s):  
Diffraction Limit ◽  
Surface Imaging ◽  
Optically Trapped

scholarly journals Breaking the diffraction limit in absorption spectroscopy using upconverting nanoparticles

Nanoscale ◽  
2021 ◽  
Author(s):  
Sumeet Kumar ◽  
Rahul Vaippully ◽  
Gunaseelan Murugan ◽  
Ayan Banerjee ◽  
Basudev Roy
Keyword(s):  
Absorption Spectroscopy ◽  
Diffraction Limit ◽  
Optically Trapped ◽  
Mode Volume

We employ a single optically trapped upconverting nanoparticle (UCNP) of NaYF$_4$:Yb,Er of diameter about 100 nm as a subdiffractive source to perform absorption spectroscopy. The experimentally expected mode volume of...

Surface Imaging Technique by an Optically Trapped Microsphere in Air Condition

2018 ◽  
Vol 1 (1) ◽  
pp. 32-38 ◽  
Author(s):  
Masaki Michihata ◽  
Jonggang Kim ◽  
Satoru Takahashi ◽  
Kiyoshi Takamasu ◽  
Yasuhiro Mizutani ◽  
...  
Keyword(s):  
Imaging Technique ◽  
Surface Imaging ◽  
Optically Trapped

Confocal Raman mapping

1992 ◽  
Vol 50 (2) ◽  
pp. 1514-1515
Author(s):  
J. Barbillat ◽  
M. Delhaye ◽  
P. Dhamelincourt
Keyword(s):  
Chemical Species ◽  
Diffraction Limit ◽  
Microscopic Level ◽  
Raman Mapping ◽  
Complete Spectrum ◽  
Laser Illumination ◽  
Ccd Detector ◽  
Raman Microprobe ◽  
Photodiode Array ◽  
Raman Image

Raman mapping, with a spatial resolution close to the diffraction limit, can help to reveal the distribution of chemical species at the surface of an heterogeneous sample.As early as 1975,three methods of sample laser illumination and detector configuration have been proposed to perform Raman mapping at the microscopic level (Fig. 1),:- Point illumination:The basic design of the instrument is a classical Raman microprobe equipped with a PM tube or either a linear photodiode array or a two-dimensional CCD detector. A laser beam is focused on a very small area ,close to the diffraction limit.In order to explore the whole surface of the sample,the specimen is moved sequentially beneath the microscope by means of a motorized XY stage. For each point analyzed, a complete spectrum is obtained from which spectral information of interest is extracted for Raman image reconstruction.- Line illuminationA narrow laser line is focused onto the sample either by a cylindrical lens or by a scanning device and is optically conjugated with the entrance slit of the stigmatic spectrograph.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Quantitative depth evaluation of microgrooves on polymer material beyond the diffraction limit

2019 ◽  
Vol 59 ◽  
pp. 56-65
Author(s):  
Shiwei Ye ◽  
Satoru Takahashi ◽  
Masaki Michihata ◽  
Kiyoshi Takamasu ◽  
Hans Nørgaard Hansen ◽  
...  
Keyword(s):  
Polymer Material ◽  
Diffraction Limit
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