scholarly journals Dynamic structural evolution of supported palladium–ceria core–shell catalysts revealed by in situ electron microscopy

2015 ◽  
Vol 6 (1) ◽  
Author(s):  
Shuyi Zhang ◽  
Chen Chen ◽  
Matteo Cargnello ◽  
Paolo Fornasiero ◽  
Raymond J. Gorte ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Evolution ◽  
Core Shell ◽  
In Situ Electron Microscopy ◽  
Supported Palladium

scholarly journals Applications of in situ electron microscopy in oxygen electrocatalysis

2022 ◽  
Author(s):  
Zhi-Peng Wu ◽  
Hui Zhang ◽  
Cailing Chen ◽  
Guanxing Li ◽  
Yu Han
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Degradation Mechanism ◽  
Structural Evolution ◽  
Reduction Reaction ◽  
Future Research ◽  
Electron Microscopic ◽  
Transmission Electron ◽  
In Situ Electron Microscopy

Oxygen electrocatalysis involving the oxygen reduction reaction (ORR) and oxygen evolution reaction (OER) plays a vital role in cutting-edge energy conversion and storage technologies. In situ studies of the evolution of catalysts during oxygen electrocatalysis can provide important insights into their structure - activity relationships and stabilities under working conditions. Among the various in situ characterization tools available, in situ electron microscopy has the unique ability to perform structural and compositional analyzes with high spatial resolution. In this review, we present the latest developments in in situ and quasi-in situ electron microscopic techniques, including identical location electron microscopy, in situ liquid cell (scanning) transmission electron microscopy and in situ environmental transmission electron microscopy, and elaborate their applications in the ORR and OER. Our discussion centers on the degradation mechanism, structural evolution and structure - performance correlations of electrocatalysts. Finally, we summarize the earlier discussions and share our perspectives on the current challenges and future research directions of using in situ electron microscopy to explore oxygen electrocatalysis and related processes.

In situ Electron Microscopy and its applications to semiconductor reactions at high-resolution

1995 ◽  
Vol 53 ◽  
pp. 222-223
Author(s):  
Robert Sinclair
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Structural Evolution ◽  
Material Behavior ◽  
Ex Situ ◽  
In Situ Electron Microscopy ◽  
Specimen Area ◽  
Underlying Mechanisms ◽  
High Degree

In situ electron microscopy experiments can provide the most revealing insights into material behavior. However, in order to take full advantage of the observations, quantitative measurements are required so that the underlying mechanisms are completely interpreted. This approach also ensures that specimen and environmental artifacts do not play a role and that real “bulk” processes are being studied. These points are illustrated in this paper by reference to work on reactions in semiconductor systems, especially at high resolution.The technique and practice of in situ microscopy are quite exacting. Thus it is often necessary to record changes in the same specimen area for extensive periods of time (e.g., hours), under identical imaging conditions. One can never be sure when a significant event will take place, or sometimes whether it has actually occurred -- accordingly a high degree of acuity on behalf of the observer is essential. A number of procedures is recommended to check that the results are representative and reproducible, including comparing the structural evolution with that from ex situ samples both qualitatively and quantitatively (e.g., [1]). Some contemporary applications are given in a recent publication.

Phase Retrieval and Induction Mapping of Artificially Structured Micromagnetic Arrays

2003 ◽  
Vol 17 (15) ◽  
pp. 791-801 ◽  
Author(s):  
V. V. Volkov ◽  
M. A. Schofield ◽  
Y. Zhu
Keyword(s):  
Electron Microscopy ◽  
Applied Field ◽  
Phase Retrieval ◽  
Structural Evolution ◽  
Switching Behavior ◽  
Electron Holography ◽  
Retrieval Method ◽  
Phase Microscopy ◽  
In Situ Electron Microscopy

We report our study on magnetic structural evolution of artificially patterned micron and submicron magnetic arrays as a function of applied field using in situ electron microscopy. To understand magnetic dynamics and switching behavior we employ our newly developed phase retrieval method, based on Lorentz phase microscopy, to map local induction distribution at nanometric scale. We outline the principle of the new method and discuss its advantages and drawbacks in comparison with off-axis electron holography.

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

Multimodal Optical Nanoprobe for Advanced In-Situ Electron Microscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 32-37 ◽  
Author(s):  
Y. Zhu ◽  
M. Milas ◽  
M.-G. Han ◽  
J.D. Rameau ◽  
M. Sfeir
Keyword(s):  
Electron Microscopy ◽  
Driving Forces ◽  
Atomic Scale ◽  
Magnetic Domains ◽  
Photovoltaic Devices ◽  
Electromagnetic Devices ◽  
In Situ Electron Microscopy ◽  
Electric And Magnetic Fields ◽  
Anions And Cations

In-situ electron microscopy has gained considerable attention in recent years. It provides a “live” view of a material or device under study at various length scales. For example, by heating or cooling a sample one can study structural change at the atomic scale to understand the driving forces and mechanisms of phase transitions. By applying electric and magnetic fields on a ferroelectric or magnetic architecture in operation, one can directly observe how electric and magnetic domains switch, how anions and cations shift their positions, and how spins change their configuration across a domain wall, aiding the development of better electromagnetic devices. In the study of photovoltaic devices and junctions, a major challenge is to directly correlate light-induced electric currents with local structural inhomogeneities and dynamics. Such a capability would allow us to evaluate the performance of individual p-n junctions and to improve optoelectronic efficiency.

In Situ Electron Microscopy Mechanical Testing of Silicon Nanowires Using Electrostatically Actuated Tensile Stages

2010 ◽  
Vol 19 (3) ◽  
pp. 663-674 ◽  
Author(s):  
Dongfeng Zhang ◽  
Jean-Marc Breguet ◽  
Reymond Clavel ◽  
Vladimir Sivakov ◽  
Silke Christiansen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mechanical Testing ◽  
Silicon Nanowires ◽  
Electrostatically Actuated ◽  
In Situ Electron Microscopy
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