scholarly journals Repeated growth and bubbling transfer of graphene with millimetre-size single-crystal grains using platinum

2012 ◽  
Vol 3 (1) ◽  
Author(s):  
Libo Gao ◽  
Wencai Ren ◽  
Huilong Xu ◽  
Li Jin ◽  
Zhenxing Wang ◽  
...  
Keyword(s):  
Single Crystal ◽  
Crystal Grains

Li7Ba3Al3O11: A new supertetrahedral oxide

2021 ◽  
Author(s):  
Yuki Nishita ◽  
Hisanori Yamane
Keyword(s):  
Single Crystal ◽  
Crystal Grains

Colorless, transparent single crystal grains were obtained from a sample prepared by heating compacts fabricated from mixtures of Li2O, BaO, and Al2O3 powders at 1093 K for 6 h in...

Stress Estimation of Titanium Casting Alloy by X-Ray Measurement Technique of Single Crystal

2010 ◽  
Vol 652 ◽  
pp. 143-148
Author(s):  
Nishida Masayuki ◽  
Hanabusa Takao ◽  
Ayumi Shiro ◽  
Tatsuya Matsue
Keyword(s):  
Residual Stress ◽  
Single Crystal ◽  
Measurement Technique ◽  
Stress Measurement ◽  
Position Effect ◽  
Casting Alloy ◽  
Diffraction Profile ◽  
Titanium Casting ◽  
X Ray ◽  
Crystal Grains

Residual stresses in titanium casting alloy were estimated by X-ray stress measurement technique. There are two problems in the condition of X-ray stress measurement. Firstly, the titanium casting alloy has the large crystal grains. These coarse grains were generated under solidification processes and those sizes are approximately 2 millimeter in this study. These coarse crystal grains interfere with an accurate stress measurement due to the unstable diffraction profile [1]. This is because the existence of a sufficient number of isotropic crystal grains in the X-ray irradiation area are based on the X-ray diffraction theory. In this study, the stress measurement technique of single crystal materials was adopted for the solution of this fundamental problem [2, 3]. Because the coarse crystal grain was treated as a single crystal, the high intensity diffraction profiles were observed from a certain direction with investigations of crystal orientation. The problem with the coarse crystal grain in titanium casting alloy were cleaned up by the employment of the single crystal measurement technique. Secondly, the results from this study show that the position of crystal grain within the X-ray irradiation area greatly influenced the residual stress values. Therefore, in the present paper the erasing method of this position effect was tried and discussed [4]. Finally, the improvement of the accuracy of this method for the residual stress measurement in titanium casting alloy under the several bending stresses was confirmed. These results show that the erasing method in this study is an effective correction method.

scholarly journals Growth morphology of single-crystal grains obtained by directional crystallisation of an Al–Cu–Fe alloy

2010 ◽  
Vol 91 (19-21) ◽  
pp. 2458-2465 ◽  
Author(s):  
Marian Surowiec ◽  
Wlodzimierz Bogdanowicz ◽  
Jacek Krawczyk ◽  
Bolesław Formanek ◽  
Maria Sozanska
Keyword(s):  
Single Crystal ◽  
Growth Morphology ◽  
Crystal Grains

High Orientation of PZT Single Crystal Grains and Piezoelectric Properties in 1-3 Type Composite Sheet

2004 ◽  
Vol 63 (1) ◽  
pp. 127-130 ◽  
Author(s):  
TADASHI SEKIYA ◽  
RUIPING WANG ◽  
HIROSHI SATO ◽  
YOSHIRO SHIMOJO
Keyword(s):  
Single Crystal ◽  
Piezoelectric Properties ◽  
Composite Sheet ◽  
Crystal Grains ◽  
High Orientation ◽  
Type Composite

Synthesis of sub-millimeter single-crystal grains of aligned hexagonal boron nitride on an epitaxial Ni film

Nanoscale ◽  
2019 ◽  
Vol 11 (31) ◽  
pp. 14668-14675
Author(s):  
Alexandre Budiman Taslim ◽  
Hideaki Nakajima ◽  
Yung-Chang Lin ◽  
Yuki Uchida ◽  
Kenji Kawahara ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Single Crystal ◽  
Growth Mechanism ◽  
Hexagonal Boron Nitride ◽  
Cvd Growth ◽  
Crystal Grains

CVD growth of epitaxially aligned, sub-millimeter h-BN grains on Ni(111)/sapphire is demonstrated with detailed investigation of the h-BN growth mechanism.

Microstructure and Tensile Properties of Sn-Ag-Cu-In-Sb Solder

2021 ◽  
Vol 1016 ◽  
pp. 553-560
Author(s):  
Yukihiko Hirai ◽  
Kouki Oomori ◽  
Hayato Morofushi ◽  
Ikuo Shohji
Keyword(s):  
Tensile Strength ◽  
Solder Joint ◽  
Single Crystal ◽  
Tensile Properties ◽  
Cross Section ◽  
The Other ◽  
The Real ◽  
Other Hand ◽  
Crystal Grains ◽  
The Cross

Microstructures and tensile properties at 233 K, 300 K and 398 K of Sn-3.0 mass%Ag-0.5 mass%Cu (SAC305) and Sn-Ag-Cu-In-Sb solder were investigated by using miniature size specimens with 0.5 mm diameter, which can reproduce the microstructure of the real solder joint. In this study, three kinds of Sn-Ag-Cu-In-Sb solder (SAC305-6.0 mass%In-1.0, 2.0 and 3.0 mass%Sb) were used. The microstructure of SAC305 consisted of a single crystal grain. On the other hand, the microstructures of Sn-Ag-Cu-In-Sb solder consisted of polycrystalline. The number of crystal grains per the cross section of SAC305-6.0In-1.0Sb was stably several tens or more. The tensile strength of Sn-Ag-Cu-In-Sb was improved approximately 2 times that of SAC305. Also, the variation in tensile strength of SAC305 at 233 K was large due to anisotropy of the crystal grain. In contrast, the variation in tensile strength of Sn-Ag-Cu-In-Sb at 233 K was lower than that of SAC305. In particular, that of SAC305-6.0In-1.0Sb was reduced to approximately a sixth of that of SAC305. It seems that the effect of anisotropy of the crystal grain is decreased by polycrystallization in SAC305-6.0In-1.0Sb.

Formation mechanism and its photo-luminescent behavior of Lu2Ti2O7 nano-plates composed of single crystal grains

CrystEngComm ◽  
2013 ◽  
Vol 15 (30) ◽  
pp. 5956 ◽  
Author(s):  
Bao-rang Li ◽  
Yang Yang ◽  
Zhongliang Hu ◽  
Yongquan Guo ◽  
Naiqiang Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
Formation Mechanism ◽  
Photo Luminescent ◽  
Crystal Grains ◽  
Luminescent Behavior

A Preparation of High Resolution Standards for Electron Microscopy. Part II

1971 ◽  
Vol 29 ◽  
pp. 160-161
Author(s):  
Akira Tanaka ◽  
David F. Harling
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Single Crystal ◽  
Dark Field ◽  
Graphitized Carbon Black ◽  
Graphitized Carbon ◽  
Dark Field Imaging ◽  
Crystal Films ◽  
Micro Holes

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.

Structure of Palladium Single-Crystal Films Prepared by Flash Evaporation onto (001) NaCl Substrates

1970 ◽  
Vol 28 ◽  
pp. 456-457
Author(s):  
L. E. Murr ◽  
G. Wong
Keyword(s):  
Single Crystal ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
High Rate ◽  
Flash Evaporation ◽  
Optimum Load ◽  
Single Crystal Films ◽  
Crystal Films ◽  
A Current

Palladium single-crystal films have been prepared by Matthews in ultra-high vacuum by evaporation onto (001) NaCl substrates cleaved in-situ, and maintained at ∼ 350° C. Murr has also produced large-grained and single-crystal Pd films by high-rate evaporation onto (001) NaCl air-cleaved substrates at 350°C. In the present work, very large (∼ 3cm2), continuous single-crystal films of Pd have been prepared by flash evaporation onto air-cleaved (001) NaCl substrates at temperatures at or below 250°C. Evaporation rates estimated to be ≧ 2000 Å/sec, were obtained by effectively short-circuiting 1 mil tungsten evaporation boats in a self-regulating system which maintained an optimum load current of approximately 90 amperes; corresponding to a current density through the boat of ∼ 4 × 104 amperes/cm2.

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