Soft-mode hardening in SrTiO3 thin films

Nature ◽  
2000 ◽  
Vol 404 (6776) ◽  
pp. 373-376 ◽  
Author(s):  
A. A. Sirenko ◽  
C. Bernhard ◽  
A. Golnik ◽  
Anna M. Clark ◽  
Jianhua Hao ◽  
...  
Keyword(s):  
2002 ◽  
Vol 748 ◽  
Author(s):  
M. Jain ◽  
A. Savvinov ◽  
P. S. Dobal ◽  
S. B. Majumder ◽  
R. S. Katiyar ◽  
...  

ABSTRACTIn this work we present the structural, and vibrational properties of ferroelectric Pb1-xSrxTiO3 (PST). Thin films of PST were prepared by using sol-gel technique for various compositions with x values ranging from 0.0–1.0. Respective compositions were also prepared in ceramic and powder forms using sol-gel and solid-state reaction methods. X-ray diffraction was used for the structural characterization of these materials. Raman spectroscopy was utilized to study the phases and lattice vibrational modes, especially the soft mode in PST compositions. The temperature dependence of the soft mode frequency for different PST compositions revealed that the phase transition temperatures increased with increasing Pb contents in PST system. Ferroelectric properties of the films were correlated with the substitution-induced changes in the material.


2009 ◽  
Vol 95 (23) ◽  
pp. 232902 ◽  
Author(s):  
D. Nuzhnyy ◽  
J. Petzelt ◽  
S. Kamba ◽  
P. Kužel ◽  
C. Kadlec ◽  
...  

2008 ◽  
Vol 93 (13) ◽  
pp. 132903 ◽  
Author(s):  
Ikufumi Katayama ◽  
Hiroshi Shimosato ◽  
Dhanvir Singh Rana ◽  
Iwao Kawayama ◽  
Masayoshi Tonouchi ◽  
...  
Keyword(s):  

1999 ◽  
Vol 603 ◽  
Author(s):  
Charles Hubert ◽  
Jeremy Levy ◽  
E. J. Cukauskas ◽  
Steven W. Kirchoefer ◽  
Jeffrey M. Pond ◽  
...  

AbstractThe soft-mode contribution to the dielectric response of Ba0.5Sr0.5TiO3 ferroelectric thin films is measured locally at microwave frequencies using time-resolved confocal scanning optical microscopy. Optical measurements performed on an ensemble of nanometer-scale regions show a well-defined phase shift between the paraelectric and ferroelectric response at 2-4 GHz. Application of a static electric field produces large local variations in the phase of the ferroelectric response. These variations are attributed to the growth of a-axis ferroelectric nanodomains whose size-dependent relaxation frequencies lead to strong dielectric dispersion at mesoscopic scales. The in-plane paraelectric response is believed to arise from the surrounding c-axis matrix and non-polar regions, and shows negligible dispersion. These results provide a direct view of the soft-mode mechanisms of microwave dielectric loss in ferroelectric thin films.


2001 ◽  
Vol 32 (1-4) ◽  
pp. 11-20 ◽  
Author(s):  
Jan Petzelt ◽  
Tetyana Ostapchuk ◽  
Ivan Gregora ◽  
Susanne Hoffmann ◽  
Johannes Lindner ◽  
...  

2001 ◽  
Vol 688 ◽  
Author(s):  
D. A. Tenne ◽  
A. M. Clark ◽  
A. R. James ◽  
A. Soukiassian ◽  
K. Chen ◽  
...  

AbstractThe vibrational properties of barium strontium titanate thin films were studied by Raman spectroscopy in the temperature range from 5 to 300 K. The films were grown by pulsed laser deposition on SrTiO3 and LaAlO3 substrates with SrRuO3 buffer layers. Soft phonons are observed in Raman spectra of BaxSr1−xTiO3 films with Ba contents x = 0.05, 0.1, 0.2 and 0.5. The temperature dependence of the soft phonon frequencies and the splitting of the triply degenerated soft mode into two components of A and E symmetries indicate the ferroelectric phase transition. The E soft mode line is overdamped over a broad range of temperatures near the ferroelectric phase transition, while it is clearly seen in the spectra at temperatures away from the phase transition. The relative Raman intensity of the A soft mode and hard modes decreases gradually over a broad range of temperatures. This indicates a broad ferroelectric phase transition in the thin films. Comparison of Raman spectra for films grown on SrTiO3 and LaAlO3 substrates shows the influence of strain on the temperature of the ferroelectric phase transition.


2001 ◽  
Vol 249 (1) ◽  
pp. 81-88 ◽  
Author(s):  
Jan Petzelt ◽  
Tetyana Ostapchuk

2005 ◽  
Vol 25 (12) ◽  
pp. 3063-3067 ◽  
Author(s):  
T. Ostapchuk ◽  
J. Pokorný ◽  
A. Pashkin ◽  
J. Petzelt ◽  
V. Železný ◽  
...  

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