scholarly journals Thin Film Research

Nature ◽  
1965 ◽  
Vol 207 (4992) ◽  
pp. 26-27 ◽  
Author(s):  
J. R. BALMER ◽  
J. H. BRUCE
Keyword(s):  
1996 ◽  
Vol 444 ◽  
Author(s):  
F. Dimeo ◽  
S. Semancik ◽  
R. E. Cavicchi ◽  
J. S. Suehle ◽  
N. H. Tea ◽  
...  
Keyword(s):  

Abstract


Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1494
Author(s):  
Mustapha El Hariri El Nokab ◽  
Khaled O. Sebakhy

Solid-state NMR has proven to be a versatile technique for studying the chemical structure, 3D structure and dynamics of all sorts of chemical compounds. In nanotechnology and particularly in thin films, the study of chemical modification, molecular packing, end chain motion, distance determination and solvent-matrix interactions is essential for controlling the final product properties and applications. Despite its atomic-level research capabilities and recent technical advancements, solid-state NMR is still lacking behind other spectroscopic techniques in the field of thin films due to the underestimation of NMR capabilities, availability, great variety of nuclei and pulse sequences, lack of sensitivity for quadrupole nuclei and time-consuming experiments. This article will comprehensively and critically review the work done by solid-state NMR on different types of thin films and the most advanced NMR strategies, which are beyond conventional, and the hardware design used to overcome the technical issues in thin-film research.


2007 ◽  
Vol 78 (7) ◽  
pp. 072206 ◽  
Author(s):  
Vladimir Matias ◽  
Brady J. Gibbons

2007 ◽  
pp. 295-307 ◽  
Author(s):  
Akhlesh Lakhtakia ◽  
Melik C. Demirel ◽  
Mark W. Horn ◽  
Jian Xu

Nature ◽  
1970 ◽  
Vol 228 (5276) ◽  
pp. 1036-1039 ◽  
Author(s):  
O. S. HEAVENS
Keyword(s):  

2012 ◽  
Vol 503 ◽  
pp. 308-311
Author(s):  
Han Chen ◽  
Hua Rong

Large-scale measurement of material property is not suit for the MEMS thin-film. Research the in-situ measuring method for material property of the MEMS thin-film is urgently. A center-anchored circular plate is adopted as the test structure here. The resonance frequency of the circular plate is measured to extract the Young’s modulus of a MEMS thin-film. The accuracy of this non-contact in-situ measuring method has been verified by CoventorWare. The inferences of the stress gradient have been analyzed. The advantages of the test structure and the measuring method present here also have been discussed.


MRS Bulletin ◽  
2000 ◽  
Vol 25 (8) ◽  
pp. 45-51 ◽  
Author(s):  
A. J. Freeman ◽  
K. R. Poeppelmeier ◽  
T. O. Mason ◽  
R. P. H. Chang ◽  
T. J. Marks

Transparent conducting oxides (TCOs) have been known and employed technologically for more than 50 years, primarily in the form of doped single-cation oxides such as In2O3 and SnO2. Beginning in the 1990s, however, multi-cation oxide TCOs began to be developed in Japan (see the article by Minami in this issue and the references therein) and at the former Bell Laboratories. Since then, new TCO phases are being reported with increasing frequency as technological interest in this area heightens. At the same time, our fundamental understanding of the chemical and structural origins of transparent conductivity continues to expand and promises a pathway to dramatically improved materials for a host of applications. This article describes a collaborative, multi-investigator bulk an d thin-film research effort at Northwestern University aimed at the synthesis, characterization, and enhanced understanding of multi-cation (compound and solidsolution) TCOs, and provides a brief account of what we are discovering about this important class of materials.


2003 ◽  
Vol 11 (5) ◽  
pp. 26-31 ◽  
Author(s):  
A. Sehgal ◽  
A. Karim ◽  
C. Stafford ◽  
M. Fasolka

Combinatorial and high-throughput (C&HT) approaches accelerate research by addressing multiple experimental parameters in a parallel or otherwise highly efficient fashion. First used by the pharmaceutical industry for product discovery, the C&HT paradigm is being extended to the study of complex materials systems that require measurements of properties and phenomena over a huge number of conditions. As with traditional materials science, microscopy and imaging of morphology are essential for C&HT materials research.


Vacuum ◽  
1967 ◽  
Vol 17 (6) ◽  
pp. 335
Author(s):  
E A Soa
Keyword(s):  

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