Distribution of X-ray- and Nitrous Acid-induced Mutations in the Genetic Fine Structure of the ad7 Locus of Schizo-saccharomyces pombe

Nature ◽  
1961 ◽  
Vol 191 (4793) ◽  
pp. 1125-1126 ◽  
Author(s):  
HERBERT GUTZ
Keyword(s):  
Fine Structure ◽  
Nitrous Acid ◽  
Induced Mutations ◽  
X Ray ◽  
Saccharomyces Pombe ◽  
Genetic Fine Structure

Distribution of Proflavin-Induced Mutations in the Genetic Fine Structure

Nature ◽  
1958 ◽  
Vol 182 (4641) ◽  
pp. 983-985 ◽  
Author(s):  
S. BRENNER ◽  
S. BENZER ◽  
L. BARNETT
Keyword(s):  
Fine Structure ◽  
Induced Mutations ◽  
Genetic Fine Structure

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

Some Aspects of Exelfs Analysis in the Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 118-119
Author(s):  
D. E. Johnson ◽  
S. Csillag
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Interference Effects ◽  
Interatomic Distances ◽  
X Ray ◽  
Structure Information ◽  
Microanalytical Technique ◽  
Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

EXTENDED X-RAY BREMSSTRAHLUNG ISOCHROMAT FINE STRUCTURE

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1121-C9-1124
Author(s):  
E. SOBCZAK ◽  
J. AULEYTNER
Keyword(s):  
Fine Structure ◽  
X Ray

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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