scholarly journals Stabilized Interference Fringes on the Retina

Nature ◽  
1956 ◽  
Vol 177 (4505) ◽  
pp. 434-434 ◽  
Author(s):  
R. W. DITCHBURN ◽  
R. M. PRITCHARD
Keyword(s):  
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.


Author(s):  
Mark Kimball

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).


2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Clément Dutreix ◽  
Matthieu Bellec ◽  
Pierre Delplace ◽  
Fabrice Mortessagne

AbstractPhase singularities appear ubiquitously in wavefields, regardless of the wave equation. Such topological defects can lead to wavefront dislocations, as observed in a humongous number of classical wave experiments. Phase singularities of wave functions are also at the heart of the topological classification of the gapped phases of matter. Despite identical singular features, topological insulators and topological defects in waves remain two distinct fields. Realising 1D microwave insulators, we experimentally observe a wavefront dislocation – a 2D phase singularity – in the local density of states when the systems undergo a topological phase transition. We show theoretically that the change in the number of interference fringes at the transition reveals the topological index that characterises the band topology in the insulator.


1979 ◽  
Vol 31 (2) ◽  
pp. 111-113 ◽  
Author(s):  
T.A. Dullforce ◽  
R.E. Faw

1991 ◽  
Vol 30 (13) ◽  
pp. 1624 ◽  
Author(s):  
Sridhar Krishnaswamy
Keyword(s):  

2014 ◽  
Vol 494-495 ◽  
pp. 1274-1277
Author(s):  
Kan Liu ◽  
Hao You

This article introduces a measurement system based on LabVIEW used for optical interference fringe on micro-fluidic chips. This system mainly uses cameras to capture real-time images of wedge interference fringe on micro-fluidic chips, then the collected images will be binarized by LabVIEW. The processed images will be divided by zone , determine the flatness and gap thickness of the micro-fluidic chips by interference fringes with different directions of deflection and numbers. Finally, feedback from measured data will be used to adjust the flatness and gap thickness of micro-fluidic chips in order to meet the requirement of tests.


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