scholarly journals Stabilized Interference Fringes on the Retina

Nature ◽  
1956 ◽  
Vol 177 (4505) ◽  
pp. 434-434 ◽  
Author(s):  
R. W. DITCHBURN ◽  
R. M. PRITCHARD
Keyword(s):  
Interference Fringes

Quanitative aspects of electron diffraction using electron holography

1995 ◽  
Vol 53 ◽  
pp. 616-617
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Software Package ◽  
Spatial Coherence ◽  
Electron Holography ◽  
Image Intensity ◽  
Interference Fringes ◽  
Complex Image ◽  
The Difference ◽  
Recorded Image

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

scholarly journals Wavefront dislocations reveal the topology of quasi-1D photonic insulators

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Clément Dutreix ◽  
Matthieu Bellec ◽  
Pierre Delplace ◽  
Fabrice Mortessagne
Keyword(s):  
Local Density ◽  
Topological Defects ◽  
Wave Functions ◽  
Topological Classification ◽  
Local Density Of States ◽  
Topological Phase Transition ◽  
Interference Fringes ◽  
Classical Wave ◽  
Phase Singularities

AbstractPhase singularities appear ubiquitously in wavefields, regardless of the wave equation. Such topological defects can lead to wavefront dislocations, as observed in a humongous number of classical wave experiments. Phase singularities of wave functions are also at the heart of the topological classification of the gapped phases of matter. Despite identical singular features, topological insulators and topological defects in waves remain two distinct fields. Realising 1D microwave insulators, we experimentally observe a wavefront dislocation – a 2D phase singularity – in the local density of states when the systems undergo a topological phase transition. We show theoretically that the change in the number of interference fringes at the transition reveals the topological index that characterises the band topology in the insulator.

High-speed cine recording of real-time holographic interference fringes

1979 ◽  
Vol 31 (2) ◽  
pp. 111-113 ◽  
Author(s):  
T.A. Dullforce ◽  
R.E. Faw
Keyword(s):  
Real Time ◽  
High Speed ◽  
Interference Fringes

Algorithm for computer tracing of interference fringes

1991 ◽  
Vol 30 (13) ◽  
pp. 1624 ◽  
Author(s):  
Sridhar Krishnaswamy
Keyword(s):  
Interference Fringes

Real-Time Micro-Fluidic Chip Pressure Control System Base on the Optical Interference

2014 ◽  
Vol 494-495 ◽  
pp. 1274-1277
Author(s):  
Kan Liu ◽  
Hao You
Keyword(s):  
Control System ◽  
Real Time ◽  
Measurement System ◽  
Interference Fringe ◽  
Pressure Control ◽  
Measured Data ◽  
Optical Interference ◽  
Interference Fringes ◽  
Pressure Control System

This article introduces a measurement system based on LabVIEW used for optical interference fringe on micro-fluidic chips. This system mainly uses cameras to capture real-time images of wedge interference fringe on micro-fluidic chips, then the collected images will be binarized by LabVIEW. The processed images will be divided by zone , determine the flatness and gap thickness of the micro-fluidic chips by interference fringes with different directions of deflection and numbers. Finally, feedback from measured data will be used to adjust the flatness and gap thickness of micro-fluidic chips in order to meet the requirement of tests.

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