scholarly journals Diffraction of X-rays by Two-Dimensional Crystal Lattice

Nature ◽  
1929 ◽  
Vol 124 (3117) ◽  
pp. 125-125 ◽  
Author(s):  
W. L. BRAGG
Nature ◽  
1929 ◽  
Vol 123 (3103) ◽  
pp. 604-605 ◽  
Author(s):  
W. LINNIK

2012 ◽  
Vol 57 (2) ◽  
pp. 92-95 ◽  
Author(s):  
E. A. Podolskaya ◽  
A. M. Krivtsov ◽  
A. Yu. Panchenko ◽  
P. V. Tkachev

2019 ◽  
Vol 43 (2) ◽  
pp. 324-331 ◽  
Author(s):  
D.V. Kirsh ◽  
A.S. Shirokanev ◽  
A.V. Kupriyanov

The article deals with a problem of three-dimensional crystal lattice reconstruction, which is an important stage in the X-ray structural analysis. The accuracy of parametric and structural identification of crystals directly depends on the quality of crystal lattice reconstruction. The proposed algorithm of reconstruction of a three-dimensional crystal lattice is based on minimizing the distances from each node to a line projected onto a specified plane. Three sets of two-dimensional node coordinates, obtained from three two-dimensional projections, are used as input data. We performed an analytical calculation of the reconstruction error, allowing the total reconstruction accuracy to be estimated. The results of computational experiments confirmed the high quality of the proposed reconstruction algorithms and its stability against the distortion of node coordinates. In addition, we revealed a problem of lattice system separability, with the identification accuracy for monoclinic, rhombic and tetragonal systems found to be 34%, 53% and 10%, respectively.


MRS Advances ◽  
2018 ◽  
Vol 3 (39) ◽  
pp. 2347-2352 ◽  
Author(s):  
Gabriel Dina ◽  
Ariel Gomez Gonzalez ◽  
Sérgio L. Morelhão ◽  
Stefan Kycia

AbstractSecond-order diffraction (SOD) of x-rays refers to all diffraction processes where the photons reaching the detector have been diffracted twice within a crystal lattice. By measuring the two dimensional intensity profile of SOD, it is possible to distinguishing rescattering processes taking place inside each grain (perfect crystal domain) or in between grains. These two SOD regimes, usually called dynamical and kinematical, respectively, are ruled by size and relative orientation of the grains. In this work, we demonstrate how to explore SOD phenomena to understand the micro scale grain structure in plastically deformed silicon single crystal.


2017 ◽  
Vol 26 (3) ◽  
pp. 224-237 ◽  
Author(s):  
Yahong Zhou ◽  
Peijun Wei ◽  
Yueqiu Li ◽  
Li Li

2021 ◽  
pp. 100450
Author(s):  
Peng Gao ◽  
Yujin Ji ◽  
Jingnan Song ◽  
Guanqing Zhou ◽  
Junqi Lai ◽  
...  

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